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Language:Chinese.No Binding.publisher:metallurgy Pub. Date :2006-11-01.description:Publisher: metallurgy Pub. Date :2006-11 -01. The book is 11 chapters. Chapter 1 of the semiconductor micro-resistance measurement techniques are analyzed and compared various methods. the sheet resistance of domestic and international test methods a
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Semiconductor Test Technology and Its Application(Chinese Edition)
Published by
metallurgy Pub. Date :2006-11-01, 2000
ISBN 10: 7502441018
ISBN 13: 9787502441012
New
paperback
Seller: liu xing, Nanjing, JS, China
Seller rating 5 out of 5 stars
paperback. Condition: New. Language:Chinese.Publisher: metallurgy Pub. Date :2006-11 -01. The book is 11 chapters. Chapter 1 of the semiconductor micro-resistance measurement techniques are analyzed and compared various methods. the sheet resistance of domestic and international test methods are reviewed; Chapter 2 is a four-probe techniques to measure the sheet resistance analysis of the principle of the conventional straight-line four probe. an improved Vanderbilt Law and oblique style square Rymaszewski four-probe m. Seller Inventory # H31815