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VLSI testing methodology and can be measured Design(Chinese Edition) - Softcover

LEI SHAO CHONG DENG ZHU

 
9787121003790: VLSI testing methodology and can be measured Design(Chinese Edition)
Softcover
ISBN 10: 7121003791 ISBN 13: 9787121003790
Publisher: Electronic Industry Press, 2000

Synopsis

Language:Chinese.Soft cover.publisher:Electronic Industry Press.description:Paperback. Publisher: Electronic Industry

"synopsis" may belong to another edition of this title.

Publisher
Electronic Industry Press
Publication date
2000
ISBN 10 
7121003791
ISBN 13 
9787121003790
Binding
Paperback