Items related to Design--for--test for digital ICs and embedded core...
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Language:Chinese.Soft cover.publisher:Machine Press.description:Paperback. Publisher: China Machine Press. this book comprehensive and systematic introduction to testing and design for testability base
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Digital integrated circuits and embedded kernel system test design (with CD-ROM)(Chinese Edition)
Seller: liu xing, Nanjing, JS, China
Seller rating 5 out of 5 stars
paperback. Condition: New. Paperback. Pub Date: 2006 05 of Pages: 284 in Publisher: Machinery Industry Press. digital integrated circuits with embedded kernel system test design (with CD) discusses the integrated circuit with embedded digital systems testing technology. and put forward many important and key solutions. Practical problems encountered in testing embedded cores and SoC test problems are discussed from the investment cost of the technology and products. Digital integrated circuits and embedded kernel syste. Seller Inventory # CC006749