Items related to micro-nano-MOS device reliability and failure mechanism
- PublisherScience Press Pub. Date :2008-03-01
- Publication date1991
- ISBN 10 7030205863
- ISBN 13 9787030205865
- BindingHardcover
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micro-nano-MOS device reliability and failure mechanism(Chinese Edition)
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Science Press Pub. Date :2008-03-01, 1991
ISBN 10: 7030205863
ISBN 13: 9787030205865
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Hardcover
Seller: liu xing, Nanjing, JS, China
Seller rating 5 out of 5 stars
Hardcover. Condition: New. Language:Chinese.Author:HAO YUE LIU HONG XIA.Binding:HardCover.Publisher:Science Press Pub. Date :2008-03-01. Seller Inventory # 844219
Quantity: 3 available