Controlling the aging of power transistors: Reliability Challenge: Controlling transistor aging and failure under short-circuit conditions - Softcover
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This book presents an in-depth experimental study of the behavior of SiC JFET transistors for demanding aerospace applications. A complete methodology is described, including the design of an automated test bench via LabView, robustness tests to determine the critical energy, and accelerated aging tests to monitor the evolution of electrical parameters. The results obtained highlight reliable degradation indicators and open up interesting prospects for the design of more resistant electronic systems in extreme environments.
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Controlling the aging of power transistors
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Controlling the aging of power transistors: Reliability Challenge: Controlling transistor aging and failure under short-circuit conditions
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ISBN 10: 6208939453
ISBN 13: 9786208939458
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Controlling the aging of power transistors
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents an in-depth experimental study of the behavior of SiC JFET transistors for demanding aerospace applications. A complete methodology is described, including the design of an automated test bench via LabView, robustness tests to determine the critical energy, and accelerated aging tests to monitor the evolution of electrical parameters. The results obtained highlight reliable degradation indicators and open up interesting prospects for the design of more resistant electronic systems in extreme environments. 88 pp. Englisch. Seller Inventory # 9786208939458
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Controlling the aging of power transistors (Paperback)
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ISBN 10: 6208939453
ISBN 13: 9786208939458
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Paperback. Condition: new. Paperback. This book presents an in-depth experimental study of the behavior of SiC JFET transistors for demanding aerospace applications. A complete methodology is described, including the design of an automated test bench via LabView, robustness tests to determine the critical energy, and accelerated aging tests to monitor the evolution of electrical parameters. The results obtained highlight reliable degradation indicators and open up interesting prospects for the design of more resistant electronic systems in extreme environments. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Seller Inventory # 9786208939458
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Controlling the aging of power transistors
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Controlling the aging of power transistors
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Controlling the aging of power transistors
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ISBN 10: 6208939453
ISBN 13: 9786208939458
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book presents an in-depth experimental study of the behavior of SiC JFET transistors for demanding aerospace applications. A complete methodology is described, including the design of an automated test bench via LabView, robustness tests to determine the critical energy, and accelerated aging tests to monitor the evolution of electrical parameters. The results obtained highlight reliable degradation indicators and open up interesting prospects for the design of more resistant electronic systems in extreme environments.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 88 pp. Englisch. Seller Inventory # 9786208939458
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Controlling the aging of power transistors | Reliability Challenge: Controlling transistor aging and failure under short-circuit conditions
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Taschenbuch. Condition: Neu. Controlling the aging of power transistors | Reliability Challenge: Controlling transistor aging and failure under short-circuit conditions | Tarek Ben Salah (u. a.) | Taschenbuch | Englisch | 2025 | Our Knowledge Publishing | EAN 9786208939458 | Verantwortliche Person für die EU: SIA OmniScriptum Publishing, Brivibas Gatve 197, 1039 RIGA, LETTLAND, customerservice[at]vdm-vsg[dot]de | Anbieter: preigu. Seller Inventory # 133536863
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Controlling the aging of power transistors : Reliability Challenge: Controlling transistor aging and failure under short-circuit conditions
Published by
Our Knowledge Publishing, 2025
ISBN 10: 6208939453
ISBN 13: 9786208939458
New
Taschenbuch
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Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book presents an in-depth experimental study of the behavior of SiC JFET transistors for demanding aerospace applications. A complete methodology is described, including the design of an automated test bench via LabView, robustness tests to determine the critical energy, and accelerated aging tests to monitor the evolution of electrical parameters. The results obtained highlight reliable degradation indicators and open up interesting prospects for the design of more resistant electronic systems in extreme environments. Seller Inventory # 9786208939458