Items related to VLSI IMPLEMENTATION OF BUILT IN SELF-TEST

VLSI IMPLEMENTATION OF BUILT IN SELF-TEST - Softcover

Fatima, M.; SAHU, SHUBHAM

 
9786207807802: VLSI IMPLEMENTATION OF BUILT IN SELF-TEST
Softcover
ISBN 10: 6207807804 ISBN 13: 9786207807802
Publisher: LAP LAMBERT Academic Publishing, 2025

Synopsis

Built-in Self-Test (BIST) is a technique that integrates additional hardware and software into integrated circuits, enabling them to perform self-testing. A key component often used in BIST is the Linear Feedback Shift Register (LFSR), a shift register where the input bit is a linear function of its previous state.BIST is the standard method for testing embedded memories. Over time, memory BIST techniques have evolved to address the growing demands of advanced technologies and markets. BIST improves testing efficiency by allowing full-speed memory access and reducing manufacturing test time through rapid, on-chip pattern generation.This book focuses on implementing BIST using Verilog HDL on Xilinx ISE 14.7. It includes the design of an LFSR and an SRAM controller to support BIST, enhancing overall system performance.

"synopsis" may belong to another edition of this title.

Publisher
LAP LAMBERT Academic Publishing
Publication date
2025
Language
English
ISBN 10 
6207807804
ISBN 13 
9786207807802
Binding
Paperback
Number of pages
64