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Synopsis
The main objective of this book was to determine the correlation and path analysis of yield and yield contributing characters in bread wheat and to assess their suitability in a breeding plan. In agriculture, Path analysis has been used by plant breeders to assist in identifying traits that are useful as selection criteria to improve crop yield. Total correlation between yield and component traits may be sometimes misleading as it might be an over-estimate and under-estimate because of its association with other character. In this research, total correlation are splitted into direct and indirect effects of cause would give more meaningful interpretation to the cause of association between the dependent variable like yield and independent variable like yield component. This kind of information will be helpful in formulating the selection criteria, indicating the selection for desirable characters is likely to bring about on overall improvement in single plant yield directly.
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Path Analysis and Genetic Parameter for Grain Yield in Bread Wheat
Published by
LAP LAMBERT Academic Publishing Mai 2019, 2019
ISBN 10: 6200092079
ISBN 13: 9786200092076
New
Taschenbuch
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The main objective of this book was to determine the correlation and path analysis of yield and yield contributing characters in bread wheat and to assess their suitability in a breeding plan. In agriculture, Path analysis has been used by plant breeders to assist in identifying traits that are useful as selection criteria to improve crop yield. Total correlation between yield and component traits may be sometimes misleading as it might be an over-estimate and under-estimate because of its association with other character. In this research, total correlation are splitted into direct and indirect effects of cause would give more meaningful interpretation to the cause of association between the dependent variable like yield and independent variable like yield component. This kind of information will be helpful in formulating the selection criteria, indicating the selection for desirable characters is likely to bring about on overall improvement in single plant yield directly. 60 pp. Englisch. Seller Inventory # 9786200092076
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Path Analysis and Genetic Parameter for Grain Yield in Bread Wheat
Published by
LAP LAMBERT Academic Publishing, 2019
ISBN 10: 6200092079
ISBN 13: 9786200092076
New
Taschenbuch
Seller: AHA-BUCH GmbH, Einbeck, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The main objective of this book was to determine the correlation and path analysis of yield and yield contributing characters in bread wheat and to assess their suitability in a breeding plan. In agriculture, Path analysis has been used by plant breeders to assist in identifying traits that are useful as selection criteria to improve crop yield. Total correlation between yield and component traits may be sometimes misleading as it might be an over-estimate and under-estimate because of its association with other character. In this research, total correlation are splitted into direct and indirect effects of cause would give more meaningful interpretation to the cause of association between the dependent variable like yield and independent variable like yield component. This kind of information will be helpful in formulating the selection criteria, indicating the selection for desirable characters is likely to bring about on overall improvement in single plant yield directly. Seller Inventory # 9786200092076
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Path Analysis and Genetic Parameter for Grain Yield in Bread Wheat
Published by
LAP LAMBERT Academic Publishing, 2019
ISBN 10: 6200092079
ISBN 13: 9786200092076
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Softcover
Seller: moluna, Greven, Germany
Seller rating 5 out of 5 stars
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Rajput Rahul SinghRahul Singh Rajput currently, working as Assistant Professor at Department of Agriculture, Mandsaur University, Mandsaur, M.P. He received his B.Sc. (Ag) and M.Sc. (Ag) degree specialized in Genetics and Plant Breed. Seller Inventory # 297256103
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Path Analysis and Genetic Parameter for Grain Yield in Bread Wheat
Published by
LAP LAMBERT Academic Publishing Mai 2019, 2019
ISBN 10: 6200092079
ISBN 13: 9786200092076
New
Taschenbuch
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The main objective of this book was to determine the correlation and path analysis of yield and yield contributing characters in bread wheat and to assess their suitability in a breeding plan. In agriculture, Path analysis has been used by plant breeders to assist in identifying traits that are useful as selection criteria to improve crop yield. Total correlation between yield and component traits may be sometimes misleading as it might be an over-estimate and under-estimate because of its association with other character. In this research, total correlation are splitted into direct and indirect effects of cause would give more meaningful interpretation to the cause of association between the dependent variable like yield and independent variable like yield component. This kind of information will be helpful in formulating the selection criteria, indicating the selection for desirable characters is likely to bring about on overall improvement in single plant yield directly.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 60 pp. Englisch. Seller Inventory # 9786200092076
Seller Image
Path Analysis and Genetic Parameter for Grain Yield in Bread Wheat
Published by
LAP LAMBERT Academic Publishing, 2019
ISBN 10: 6200092079
ISBN 13: 9786200092076
New
Taschenbuch
Seller: preigu, Osnabrück, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. Path Analysis and Genetic Parameter for Grain Yield in Bread Wheat | Rahul Singh Rajput | Taschenbuch | 60 S. | Englisch | 2019 | LAP LAMBERT Academic Publishing | EAN 9786200092076 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu. Seller Inventory # 116814294