Synopsis
Part I Threats against and Mitigation for Dependability.- Scope of Part I.- Radiation-Induced Soft Errors.- Electromagnetic Noises.- Variations in Device Characteristics.- Time-Dependent Degradation in Device Characteristics.- Connectivity.- Responsiveness.- Security.- Test Coverage.- Future and/or Un-Identified Problems. Part II Scope of Part II.- Design Verification.- Virtualization.- In-Line Testing.- Robust Memory 1 - SRAM and Cache.- Robust Memory 2 - Non-Volatile.- 3D Integration.- On-Chip Network for Dependability.- Wireless Interconnect for Connectivity.- Hard Real-Time Responsive Processor.- Connectivity in Wireless Communications.- A Re-Configurable Processor Architecture.- Security Component for Authentication.
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