Gettering and Defect Engineering in Semiconductor Technology XII: Volumes 131-133 (Solid State Phenomena, Volumes 131-133) - Softcover
Synopsis
Volume is indexed by Thomson Reuters CPCI-S (WoS).
This collection comprises 117 peerreviewed papers invited from over 70 research institutions in more than 25 countries. These papers, written by internationally recognized experts in the field, review the current state-of-the-art and predict future trends in their respective authors’ fields of research. Fundamental aspects, as well as technological problems associated with defects in electronic materials and devices, are addressed
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Gettering And Defect Engineering In Semiconductor Technology XII: Gadest 2007 : Proceedings of the 12th International Autumn Meeting Emfcsc, Erice, Italy October 14-19, 2007 (Solid State Phenomena)
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Trans Tech Publications, Ltd., 2008
ISBN 10: 3908451434
ISBN 13: 9783908451433
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