Statistical Circuit Simulations: From ‘Atomistic’ Compact Models to Statistical Standard Cell Characterisation - Softcover

Kamsani, Noor Ain

Softcover

ISBN 10: 3847344137 ISBN 13: 9783847344131

Publisher: LAP LAMBERT Academic Publishing, 2012

Synopsis

This work describes the development and application of statistical circuit simulation methodologies to analyse digital circuits subject to intrinsic parameter fluctuations. The specific nature of intrinsic parameter fluctuations are discussed, and the crucial importance to the semiconductor industry of developing design tools which accurately account for their effects are explained. Current work in the area is reviewed, and three important factors are made clear: any statistical circuit simulation methodology must be based on physically correct, predictive models of device variability; the statistical compact models describing device operation must be characterised for accurate transient analysis of circuits; analysis must be carried out on realistic circuit components.

About this title

About the Author

Noor Ain Kamsani received BEng from Universiti Tenaga Nasional, Malaysia in 2006 and PhD from University of Glasgow in 2011. She spent one year at Intel Penang Design Center, Malaysia working on DFT features in ICH. Currently, she is a lecturer at Universiti Putra Malaysia and her research interests are IC design & validation and compact modeling.

Edition details

• Publisher: LAP LAMBERT Academic Publishing
• Publication date: 2012
• Language: English
• ISBN 10: 3847344137
• ISBN 13: 9783847344131
• Binding: Paperback
• Number of pages: 204