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Electron Impact Ionization and High-Resolution Electron Attachment: Studies of Relaxation Mechanisms in Argon Dimers Upon Electron Impact and Electron Attachment to Doped Helium Droplets - Softcover
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In this study, investigation of some low electron (<100eV)interactions with and within clusters was conducted. For this investigation, two apparatuses were employed. A helium droplet source combined with a hemispherical electron monochromator and a quadrupole mass spectrometer, and a rare gas cluster source combined with an electron impact reaction microscope. Evidence for two relaxation channels in argon dimer was found and clearly separated. High-resolution electron attachment to helium atoms inside helium droplets led to the accurate determination of the positions of three resonance structures and a fourth newly identified structure. The evolution of the conduction band of helium droplets with the evolution of their size was revealed with high accuracy. It was disclosed that the electron attachment water clusters gradually becomes more and more favored at slightly higher projectile electron energies as the cluster gets larger. This observation is traced back to the different structure for clusters consisting of different number of water molecules.
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Electron Impact Ionization and High-Resolution Electron Attachment
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Südwestdeutscher Verlag Für Hochschulschriften Sep 2016, 2016
ISBN 10: 3838152689
ISBN 13: 9783838152684
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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -In this study, investigation of some low electron (100eV)interactions with and within clusters was conducted. For this investigation, two apparatuses were employed. A helium droplet source combined with a hemispherical electron monochromator and a quadrupole mass spectrometer, and a rare gas cluster source combined with an electron impact reaction microscope. Evidence for two relaxation channels in argon dimer was found and clearly separated. High-resolution electron attachment to helium atoms inside helium droplets led to the accurate determination of the positions of three resonance structures and a fourth newly identified structure. The evolution of the conduction band of helium droplets with the evolution of their size was revealed with high accuracy. It was disclosed that the electron attachment water clusters gradually becomes more and more favored at slightly higher projectile electron energies as the cluster gets larger. This observation is traced back to the different structure for clusters consisting of different number of water molecules. 220 pp. Englisch. Seller Inventory # 9783838152684
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Electron Impact Ionization and High-Resolution Electron Attachment
Published by
Südwestdeutscher Verlag für Hochschulschriften, 2016
ISBN 10: 3838152689
ISBN 13: 9783838152684
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Jabbour Al Maalouf EliasElias Jabbour Al Maalouf was born in Lebanon. He attended high school there. He attained his B.S. in physics at the Lebanese university, a Masters in physics (Laser Applications in Medicine and Industry)after . Seller Inventory # 151606190
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Electron Impact Ionization and High-Resolution Electron Attachment : Studies of Relaxation Mechanisms in Argon Dimers Upon Electron Impact and Electron Attachment to Doped Helium Droplets
Published by
Südwestdeutscher Verlag Für Hochschulschriften, 2016
ISBN 10: 3838152689
ISBN 13: 9783838152684
New
Taschenbuch
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Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - In this study, investigation of some low electron (100eV)interactions with and within clusters was conducted. For this investigation, two apparatuses were employed. A helium droplet source combined with a hemispherical electron monochromator and a quadrupole mass spectrometer, and a rare gas cluster source combined with an electron impact reaction microscope. Evidence for two relaxation channels in argon dimer was found and clearly separated. High-resolution electron attachment to helium atoms inside helium droplets led to the accurate determination of the positions of three resonance structures and a fourth newly identified structure. The evolution of the conduction band of helium droplets with the evolution of their size was revealed with high accuracy. It was disclosed that the electron attachment water clusters gradually becomes more and more favored at slightly higher projectile electron energies as the cluster gets larger. This observation is traced back to the different structure for clusters consisting of different number of water molecules. Seller Inventory # 9783838152684
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Electron Impact Ionization and High-Resolution Electron Attachment | Studies of Relaxation Mechanisms in Argon Dimers Upon Electron Impact and Electron Attachment to Doped Helium Droplets
Published by
Südwestdeutscher Verlag für Hochschulschriften, 2016
ISBN 10: 3838152689
ISBN 13: 9783838152684
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Seller: preigu, Osnabrück, Germany
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Taschenbuch. Condition: Neu. Electron Impact Ionization and High-Resolution Electron Attachment | Studies of Relaxation Mechanisms in Argon Dimers Upon Electron Impact and Electron Attachment to Doped Helium Droplets | Elias Jabbour Al Maalouf | Taschenbuch | 220 S. | Englisch | 2016 | Südwestdeutscher Verlag für Hochschulschriften | EAN 9783838152684 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. Seller Inventory # 102873557
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Electron Impact Ionization and High-Resolution Electron Attachment
Published by
Südwestdeutscher Verlag Für Hochschulschriften Sep 2016, 2016
ISBN 10: 3838152689
ISBN 13: 9783838152684
New
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -In this study, investigation of some low electron (VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 220 pp. Englisch. Seller Inventory # 9783838152684
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Electron Impact Ionization and High-Resolution Electron Attachment: Studies of Relaxation Mechanisms in Argon Dimers Upon Electron Impact and Electron Attachment to Doped Helium Droplets
Published by
S dwestdeutscher Verlag f r Hochschulschriften, 2016
ISBN 10: 3838152689
ISBN 13: 9783838152684
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paperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book. Seller Inventory # ERICA82938381526896