Items related to Retroreflex Ellipsometry for Nonplanar Surfaces (Schriftenre...

Retroreflex Ellipsometry for Nonplanar Surfaces (Schriftenreihe Automatische Sichtprüfung und Bildverarbeitung) - Softcover

Chen, Chia-Wei

 
9783731514022: Retroreflex Ellipsometry for Nonplanar Surfaces (Schriftenreihe Automatische Sichtprüfung und Bildverarbeitung)

Synopsis

Retroreflex ellipsometry addresses the geometric restrictions of conventional ellipsometry by using a retroreflective sheet, which returns the light beam from the sample on the same beam path. Simulation and experiments of retroreflex ellipsometry in two- and three-phase systems have been demonstrated based on the proposed concepts, which have shown the capabilities of ellipsometric measurements on nonplanar surfaces.

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