Items related to Silicon Microstrip Detectors: Basic Characterization...
Silicon Microstrip Detectors: Basic Characterization & QA: A step-wise approach to basic electrical characterization and its quality assurance procedures - Softcover
Synopsis
The Silicon Tracking System (STS) is main detector system in the Compressed Baryonic Matter experiment at FAIR and responsible for the reconstruction of the trajectories and momentum of all the charged particles originating from the interaction of heavy-ion beams and fixed target. Up to 1000 charged particles are produced per interaction, at rates up to 10 MHz to enable CBM physics with rare observables. The track reconstruction has to be achieved with 95% efficiency and a momentum resolution 1%. These requirements can be fulfilled with a tracking system of 8 low-mass layers of silicon microstrip sensors located at distances between 30 cm and 100 cm downstream of the target inside the dipole magnetic field. This book describes the characterization procedures for the prototype double-sided silicon microstrip sensors produced for the Silicon Tracking System (STS), the core detector system of the Compressed Baryonic Matter (CBM) Experiment at FAIR. The idea behind this book is to realise and investigate important and significant tests and measurements which have to be performed to characterise and investigate the overall health, operation ability & its noise performance.
"synopsis" may belong to another edition of this title.
About the Author
The author is presently working in Science Administration & Communication at FAIR GmbH. He accomplished his PhD in Physics from Goethe University, Frankfurt Germany. With M.Tech in Nuclear Engineering from Delhi University and Bachelors in Physics, his interests lie in silicon detectors & its quality assurance, nuclear reactors and neutron physics.
"About this title" may belong to another edition of this title.
Search results for Silicon Microstrip Detectors: Basic Characterization...
Seller Image
Silicon Microstrip Detectors: Basic Characterization & QA
Published by
LAP LAMBERT Academic Publishing Aug 2016, 2016
ISBN 10: 3659900044
ISBN 13: 9783659900044
New
Taschenbuch
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The Silicon Tracking System (STS) is main detector system in the Compressed Baryonic Matter experiment at FAIR and responsible for the reconstruction of the trajectories and momentum of all the charged particles originating from the interaction of heavy-ion beams and fixed target. Up to 1000 charged particles are produced per interaction, at rates up to 10 MHz to enable CBM physics with rare observables. The track reconstruction has to be achieved with 95% efficiency and a momentum resolution 1%. These requirements can be fulfilled with a tracking system of 8 low-mass layers of silicon microstrip sensors located at distances between 30 cm and 100 cm downstream of the target inside the dipole magnetic field. This book describes the characterization procedures for the prototype double-sided silicon microstrip sensors produced for the Silicon Tracking System (STS), the core detector system of the Compressed Baryonic Matter (CBM) Experiment at FAIR. The idea behind this book is to realise and investigate important and significant tests and measurements which have to be performed to characterise and investigate the overall health, operation ability & its noise performance. 124 pp. Englisch. Seller Inventory # 9783659900044
Stock Image
Silicon Microstrip Detectors: Basic Characterization & QA: A step-wise approach to basic electrical characterization and its quality assurance procedures
Published by
LAP LAMBERT Academic Publishing, 2016
ISBN 10: 3659900044
ISBN 13: 9783659900044
New
Paperback
Seller: Revaluation Books, Exeter, United Kingdom
Seller rating 5 out of 5 stars
Paperback. Condition: Brand New. 124 pages. 8.66x5.91x0.28 inches. In Stock. Seller Inventory # __3659900044
Buy New
£ 85.22
£ 10 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: 1 available
Seller Image
Silicon Microstrip Detectors: Basic Characterization & QA
Published by
LAP LAMBERT Academic Publishing Aug 2016, 2016
ISBN 10: 3659900044
ISBN 13: 9783659900044
New
Taschenbuch
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The Silicon Tracking System (STS) is main detector system in the Compressed Baryonic Matter experiment at FAIR and responsible for the reconstruction of the trajectories and momentum of all the charged particles originating from the interaction of heavy-ion beams and fixed target. Up to 1000 charged particles are produced per interaction, at rates up to 10 MHz to enable CBM physics with rare observables. The track reconstruction has to be achieved with 95% efficiency and a momentum resolution 1%. These requirements can be fulfilled with a tracking system of 8 low-mass layers of silicon microstrip sensors located at distances between 30 cm and 100 cm downstream of the target inside the dipole magnetic field. This book describes the characterization procedures for the prototype double-sided silicon microstrip sensors produced for the Silicon Tracking System (STS), the core detector system of the Compressed Baryonic Matter (CBM) Experiment at FAIR. The idea behind this book is to realise and investigate important and significant tests and measurements which have to be performed to characterise and investigate the overall health, operation ability & its noise performance.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 124 pp. Englisch. Seller Inventory # 9783659900044
Seller Image
Silicon Microstrip Detectors: Basic Characterization & QA : A step-wise approach to basic electrical characterization and its quality assurance procedures
Published by
LAP LAMBERT Academic Publishing, 2016
ISBN 10: 3659900044
ISBN 13: 9783659900044
New
Taschenbuch
Seller: AHA-BUCH GmbH, Einbeck, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The Silicon Tracking System (STS) is main detector system in the Compressed Baryonic Matter experiment at FAIR and responsible for the reconstruction of the trajectories and momentum of all the charged particles originating from the interaction of heavy-ion beams and fixed target. Up to 1000 charged particles are produced per interaction, at rates up to 10 MHz to enable CBM physics with rare observables. The track reconstruction has to be achieved with 95% efficiency and a momentum resolution 1%. These requirements can be fulfilled with a tracking system of 8 low-mass layers of silicon microstrip sensors located at distances between 30 cm and 100 cm downstream of the target inside the dipole magnetic field. This book describes the characterization procedures for the prototype double-sided silicon microstrip sensors produced for the Silicon Tracking System (STS), the core detector system of the Compressed Baryonic Matter (CBM) Experiment at FAIR. The idea behind this book is to realise and investigate important and significant tests and measurements which have to be performed to characterise and investigate the overall health, operation ability & its noise performance. Seller Inventory # 9783659900044
Seller Image
Silicon Microstrip Detectors: Basic Characterization & QA | A step-wise approach to basic electrical characterization and its quality assurance procedures
Published by
LAP LAMBERT Academic Publishing, 2016
ISBN 10: 3659900044
ISBN 13: 9783659900044
New
Taschenbuch
Seller: preigu, Osnabrück, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. Silicon Microstrip Detectors: Basic Characterization & QA | A step-wise approach to basic electrical characterization and its quality assurance procedures | Pradeep Ghosh | Taschenbuch | 124 S. | Englisch | 2016 | LAP LAMBERT Academic Publishing | EAN 9783659900044 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. Seller Inventory # 103381148
Stock Image
Silicon Microstrip Detectors: Basic Characterization & QA: A step-wise approach to basic electrical characterization and its quality assurance procedures
Published by
LAP LAMBERT Academic Publishing, 2016
ISBN 10: 3659900044
ISBN 13: 9783659900044
New
paperback
Seller: Mispah books, Redhill, SURRE, United Kingdom
Seller rating 4 out of 5 stars
paperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book. Seller Inventory # ERICA82936599000446