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Fault Tolerant & Testable Sequential Reversible Circuit Design: A Designers Approach to Realize Fault Tolerant Sequential Reversible Circuit - Softcover
Synopsis
Fast growing computing demands the power consumption and chip size issues are posing challenges for logic design with conventional technologies because of the above reliability in conventional technologies is also becoming important. Reversible computing is emerging as an alternative that offers high computation speed, high packaging density and low heat dissipation. This book expands on many of the most popular reversible computing topics such as sequential reversible building block, parity preservation and fault tolerant characteristics of sequential circuits for addressing the reliability issues. In this book, we have reported a Pareek gate suitable for low cost flip-flops design and then design methodology to develop flip-flops are incorporated. Finally, these circuits have been converted into fault tolerant circuits by preserving their parity and designs of offline as well as online testable circuits have been proposed. In addition, the text book presents the statistical results of proposed designs over quantum cost as well as other optimization parameters with existing circuits in literature and a significant improvement is achieved in almost all the parameters.
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- PublisherLAP Lambert Academic Publishing
- Publication date2015
- ISBN 10 3659671681
- ISBN 13 9783659671685
- BindingPaperback
- LanguageEnglish
- Number of pages76
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Fault Tolerant & Testable Sequential Reversible Circuit Design: A Designers Approach to Realize Fault Tolerant Sequential Reversible Circuit
Published by
LAP LAMBERT Academic Publishing,, 2015
ISBN 10: 3659671681
ISBN 13: 9783659671685
Used
Softcover
Seller: Roland Antiquariat UG haftungsbeschränkt, Weinheim, Germany
Seller rating 5 out of 5 stars
58 Seiten Am unteren Buchschnitt mittels Stempel als "Mängelexemplar" gekennzeichnet, jedoch innen wie außen ein sehr gutes Exemplar, fast wie neu. Die Leseseiten sind tadellos, sauber und ohne Anstreichungen. 9783659671685 Sprache: Englisch Gewicht in Gramm: 127 Taschenbuch, Größe: 15.2 x 0.5 x 22.9 cm. Seller Inventory # 257038
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Fault Tolerant & Testable Sequential Reversible Circuit Design
Published by
LAP LAMBERT Academic Publishing Jan 2015, 2015
ISBN 10: 3659671681
ISBN 13: 9783659671685
New
Taschenbuch
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Fast growing computing demands the power consumption and chip size issues are posing challenges for logic design with conventional technologies because of the above reliability in conventional technologies is also becoming important. Reversible computing is emerging as an alternative that offers high computation speed, high packaging density and low heat dissipation. This book expands on many of the most popular reversible computing topics such as sequential reversible building block, parity preservation and fault tolerant characteristics of sequential circuits for addressing the reliability issues. In this book, we have reported a Pareek gate suitable for low cost flip-flops design and then design methodology to develop flip-flops are incorporated. Finally, these circuits have been converted into fault tolerant circuits by preserving their parity and designs of offline as well as online testable circuits have been proposed. In addition, the text book presents the statistical results of proposed designs over quantum cost as well as other optimization parameters with existing circuits in literature and a significant improvement is achieved in almost all the parameters. 76 pp. Englisch. Seller Inventory # 9783659671685
Quantity: 2 available
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Fault Tolerant & Testable Sequential Reversible Circuit Design : A Designers Approach to Realize Fault Tolerant Sequential Reversible Circuit
Published by
LAP LAMBERT Academic Publishing, 2015
ISBN 10: 3659671681
ISBN 13: 9783659671685
New
Taschenbuch
Seller: AHA-BUCH GmbH, Einbeck, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Fast growing computing demands the power consumption and chip size issues are posing challenges for logic design with conventional technologies because of the above reliability in conventional technologies is also becoming important. Reversible computing is emerging as an alternative that offers high computation speed, high packaging density and low heat dissipation. This book expands on many of the most popular reversible computing topics such as sequential reversible building block, parity preservation and fault tolerant characteristics of sequential circuits for addressing the reliability issues. In this book, we have reported a Pareek gate suitable for low cost flip-flops design and then design methodology to develop flip-flops are incorporated. Finally, these circuits have been converted into fault tolerant circuits by preserving their parity and designs of offline as well as online testable circuits have been proposed. In addition, the text book presents the statistical results of proposed designs over quantum cost as well as other optimization parameters with existing circuits in literature and a significant improvement is achieved in almost all the parameters. Seller Inventory # 9783659671685
Quantity: 1 available
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Fault Tolerant & Testable Sequential Reversible Circuit Design
Published by
LAP LAMBERT Academic Publishing, 2015
ISBN 10: 3659671681
ISBN 13: 9783659671685
New
Softcover
Seller: moluna, Greven, Germany
Seller rating 5 out of 5 stars
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Pareek VishalVishal Pareek has completed his M.Tech degree in Computer Science & Engineering from UCE, Rajasthan Technical University, Kota, Rajasthan under the guidance of Dr. Sushil Chandra Jain in 2014. His main research interests. Seller Inventory # 17694401
Quantity: Over 20 available