Synopsis
In this work, an integrated digital thermometer was designed at transistor level in 0.18μm BiCMOS SiGe technology for a temperature range of -50 ˚C to 130 ˚C. The 1σ accuracy achieved at 100 ˚C is 1.21 ˚C. The digital thermometer consists of temperature sensor, Instrumentation amplifier (pre-amplifier), Sample-and-Hold, Comparator, Successive Approximation Register (SAR) and Digital-to-Analog Converter (DAC). The ADC designed is a successive approximation register (SAR) ADC having a sampling rate of 5 kS/s at 3V. The main thrust of this work was to have a minimum error. As the major error source is the sensor, three different sensor topologies were designed, tested and evaluated for minimum error and size. Monte Carlo simulations were performed to check for the process and mismatch variations. The data from Monte Carlo simulation was then used to measure the error.
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About the Author
Received BS in Computer Engineering from COMSATS institute of information technology, Pakistan in 2007 and MS in Wireless Networks & Electronics from Linköping University, Sweden in 2013.
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Integrated Digital Thermometer in a BiCMOS Technology
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LAP LAMBERT Academic Publishing Aug 2013, 2013
ISBN 10: 3659433373
ISBN 13: 9783659433375
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -In this work, an integrated digital thermometer was designed at transistor level in 0.18mim BiCMOS SiGe technology for a temperature range of -50 C to 130 C. The 1s accuracy achieved at 100 C is 1.21 C. The digital thermometer consists of temperature sensor, Instrumentation amplifier (pre-amplifier), Sample-and-Hold, Comparator, Successive Approximation Register (SAR) and Digital-to-Analog Converter (DAC). The ADC designed is a successive approximation register (SAR) ADC having a sampling rate of 5 kS/s at 3V. The main thrust of this work was to have a minimum error. As the major error source is the sensor, three different sensor topologies were designed, tested and evaluated for minimum error and size. Monte Carlo simulations were performed to check for the process and mismatch variations. The data from Monte Carlo simulation was then used to measure the error. 124 pp. Englisch. Seller Inventory # 9783659433375
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Integrated Digital Thermometer in a BiCMOS Technology
Published by
LAP LAMBERT Academic Publishing Aug 2013, 2013
ISBN 10: 3659433373
ISBN 13: 9783659433375
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Taschenbuch
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -In this work, an integrated digital thermometer was designed at transistor level in 0.18¿m BiCMOS SiGe technology for a temperature range of -50 ¿C to 130 ¿C. The 1¿ accuracy achieved at 100 ¿C is 1.21 ¿C. The digital thermometer consists of temperature sensor, Instrumentation amplifier (pre-amplifier), Sample-and-Hold, Comparator, Successive Approximation Register (SAR) and Digital-to-Analog Converter (DAC). The ADC designed is a successive approximation register (SAR) ADC having a sampling rate of 5 kS/s at 3V. The main thrust of this work was to have a minimum error. As the major error source is the sensor, three different sensor topologies were designed, tested and evaluated for minimum error and size. Monte Carlo simulations were performed to check for the process and mismatch variations. The data from Monte Carlo simulation was then used to measure the error.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 124 pp. Englisch. Seller Inventory # 9783659433375
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Integrated Digital Thermometer in a BiCMOS Technology
Published by
LAP LAMBERT Academic Publishing, 2013
ISBN 10: 3659433373
ISBN 13: 9783659433375
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Taschenbuch
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Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - In this work, an integrated digital thermometer was designed at transistor level in 0.18mim BiCMOS SiGe technology for a temperature range of -50 C to 130 C. The 1s accuracy achieved at 100 C is 1.21 C. The digital thermometer consists of temperature sensor, Instrumentation amplifier (pre-amplifier), Sample-and-Hold, Comparator, Successive Approximation Register (SAR) and Digital-to-Analog Converter (DAC). The ADC designed is a successive approximation register (SAR) ADC having a sampling rate of 5 kS/s at 3V. The main thrust of this work was to have a minimum error. As the major error source is the sensor, three different sensor topologies were designed, tested and evaluated for minimum error and size. Monte Carlo simulations were performed to check for the process and mismatch variations. The data from Monte Carlo simulation was then used to measure the error. Seller Inventory # 9783659433375
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Integrated Digital Thermometer in a BiCMOS Technology
Published by
LAP LAMBERT Academic Publishing, 2013
ISBN 10: 3659433373
ISBN 13: 9783659433375
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Taschenbuch. Condition: Neu. Integrated Digital Thermometer in a BiCMOS Technology | Muhammad Fahim Aamir | Taschenbuch | 124 S. | Englisch | 2013 | LAP LAMBERT Academic Publishing | EAN 9783659433375 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. Seller Inventory # 105691082
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Integrated Digital Thermometer in a BiCMOS Technology
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ISBN 10: 3659433373
ISBN 13: 9783659433375
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