On Network Embeddings: A Study of Various Parameters of Graph Embeddings and Fault Tolerance in Networks - Softcover

R., Sundara Rajan; Rajasingh, Indra

Softcover

ISBN 10: 365935886X ISBN 13: 9783659358869

Publisher: LAP LAMBERT Academic Publishing, 2013

Synopsis

Graph theory is becoming increasingly significant as it is applied to areas of mathematics and science & technology. It is being actively used in fields as varied as biochemistry, electrical engineering, computer science and operations research. Graph embedding is an important technique used in the study of computational capabilities of processor interconnection networks and task distribution. Embeddings of graphs from one class of graphs into another class have important applications in the field of computer science. In the design and implementation of parallel and distributed computing systems, one fundamental issue is the design of the interconnection network through which the computing elements can communicate efficiently. A measure of reliability and fault tolerance of the overall interconnection networks is given by the maximum number of nodes which can fail simultaneously without prohibiting other non-faulty nodes from communicating with others. In this work the authors discussed the embedding parameters such as dilation, congestion and wirelenth of certain interconnection networks. Further, they studied faulty interconnection networks.

About this title

About the Author

Dr. R. Sundara Rajan is a Post Doctoral Fellow in VIT University, Chennai Campus under NBHM Fellowship. He obtained his Ph.D in Mathematics from University of Madras in 2012. His specialization is Theoretical Computer Science. Dr. Indra Rajasingh, Research Guide and Professor, SAS, VIT University, Chennai Campus, supervised this research.

Edition details

• Publisher: LAP LAMBERT Academic Publishing
• Publication date: 2013
• Language: English
• ISBN 10: 365935886X
• ISBN 13: 9783659358869
• Binding: Paperback
• Number of pages: 160