Items related to SEM, EDAX & AFM study of ZnTe films deposited using...
Synopsis
In present book, AFM has been used to measure surface morphology. For microanalysis the scanning electron microscope (SEM) has been used. The scanning electron microscope (SEM), which is closely related to the electron probe, is designed primarily for producing electron images, but can also be used for elements mapping, and even point analysis.Scanning electron microscopes which are equipped with EDS (Energy Dispersed Spectroscopy) or EDAX (Energy-Dispersed Analysis of X-rays) detectors that capture the emitted X-ray is used for elemental analysis. The results, analysis and conclusions of ZnTe thin films deposited by SILAR method at various thicknesses and annealing temperatures have been carried out in detail and are presented in this book.
"synopsis" may belong to another edition of this title.
About the Author
Jignesh Rathod has done M.Sc(Solid State Electronics)& M.Phil(Thin Film Technology)from S.P.University. He has been pursuing doctorate degree in thin film technology under the guidance of Prof.V.M.Pathak. He has been published many papers in renowned international journals,conferences &seminars.He has also worked as faculty in Engineering Colleges.
"About this title" may belong to another edition of this title.
Search results for SEM, EDAX & AFM study of ZnTe films deposited using...
Seller Image
SEM, EDAX & AFM study of ZnTe films deposited using SILAR method
Published by
LAP LAMBERT Academic Publishing Mär 2014, 2014
ISBN 10: 3659258296
ISBN 13: 9783659258299
New
Taschenbuch
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -In present book, AFM has been used to measure surface morphology. For microanalysis the scanning electron microscope (SEM) has been used. The scanning electron microscope (SEM), which is closely related to the electron probe, is designed primarily for producing electron images, but can also be used for elements mapping, and even point analysis.Scanning electron microscopes which are equipped with EDS (Energy Dispersed Spectroscopy) or EDAX (Energy-Dispersed Analysis of X-rays) detectors that capture the emitted X-ray is used for elemental analysis. The results, analysis and conclusions of ZnTe thin films deposited by SILAR method at various thicknesses and annealing temperatures have been carried out in detail and are presented in this book. 64 pp. Englisch. Seller Inventory # 9783659258299
Stock Image
Sem, Edax & AFM Study of Znte Films Deposited Using Silar Method
Published by
VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2014
ISBN 10: 3659258296
ISBN 13: 9783659258299
New
Softcover
Seller: Books Puddle, Woodside, NY, U.S.A.
Seller rating 4 out of 5 stars
Condition: New. pp. 64. Seller Inventory # 26127869887
Stock Image
Sem, Edax & AFM Study of Znte Films Deposited Using Silar Method
Published by
VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2014
ISBN 10: 3659258296
ISBN 13: 9783659258299
New
Softcover
Seller: Majestic Books, Hounslow, United Kingdom
Seller rating 4 out of 5 stars
Condition: New. Print on Demand pp. 64 2:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on Creme w/Gloss Lam. Seller Inventory # 132684896
Buy New
£ 55.46
£ 6.50 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: 4 available
Stock Image
Sem, Edax & AFM Study of Znte Films Deposited Using Silar Method
Published by
VDM Verlag Dr. Mueller Aktiengesellschaft & Co. KG, 2014
ISBN 10: 3659258296
ISBN 13: 9783659258299
New
Softcover
Seller: Biblios, Frankfurt am main, HESSE, Germany
Seller rating 4 out of 5 stars
Condition: New. PRINT ON DEMAND pp. 64. Seller Inventory # 18127869877
Seller Image
SEM, EDAX & AFM study of ZnTe films deposited using SILAR method
Published by
LAP LAMBERT Academic Publishing, 2014
ISBN 10: 3659258296
ISBN 13: 9783659258299
New
Softcover
Seller: moluna, Greven, Germany
Seller rating 5 out of 5 stars
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Rathod JigneshJignesh Rathod has done M.Sc(Solid State Electronics)& M.Phil(Thin Film Technology)from S.P.University. He has been pursuing doctorate degree in thin film technology under the guidance of Prof.V.M.Pathak. He has been pu. Seller Inventory # 5143685
Buy New
£ 30.35
£ 41.53 shipping
Ships from Germany to U.S.A.
Ships from Germany to U.S.A.
Quantity: Over 20 available
Seller Image
SEM, EDAX & AFM study of ZnTe films deposited using SILAR method
Published by
LAP LAMBERT Academic Publishing, 2014
ISBN 10: 3659258296
ISBN 13: 9783659258299
New
Taschenbuch
Seller: AHA-BUCH GmbH, Einbeck, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - In present book, AFM has been used to measure surface morphology. For microanalysis the scanning electron microscope (SEM) has been used. The scanning electron microscope (SEM), which is closely related to the electron probe, is designed primarily for producing electron images, but can also be used for elements mapping, and even point analysis.Scanning electron microscopes which are equipped with EDS (Energy Dispersed Spectroscopy) or EDAX (Energy-Dispersed Analysis of X-rays) detectors that capture the emitted X-ray is used for elemental analysis. The results, analysis and conclusions of ZnTe thin films deposited by SILAR method at various thicknesses and annealing temperatures have been carried out in detail and are presented in this book. Seller Inventory # 9783659258299
Stock Image
SEM, EDAX & AFM study of ZnTe films deposited using SILAR method
Published by
LAP LAMBERT Academic Publishing, 2014
ISBN 10: 3659258296
ISBN 13: 9783659258299
Used
Paperback
Seller: Mispah books, Redhill, SURRE, United Kingdom
Seller rating 4 out of 5 stars
Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book. Seller Inventory # ERICA75836592582965
Seller Image
SEM, EDAX & AFM study of ZnTe films deposited using SILAR method
Published by
LAP LAMBERT Academic Publishing Mär 2014, 2014
ISBN 10: 3659258296
ISBN 13: 9783659258299
New
Taschenbuch
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -In present book, AFM has been used to measure surface morphology. For microanalysis the scanning electron microscope (SEM) has been used. The scanning electron microscope (SEM), which is closely related to the electron probe, is designed primarily for producing electron images, but can also be used for elements mapping, and even point analysis.Scanning electron microscopes which are equipped with EDS (Energy Dispersed Spectroscopy) or EDAX (Energy-Dispersed Analysis of X-rays) detectors that capture the emitted X-ray is used for elemental analysis. The results, analysis and conclusions of ZnTe thin films deposited by SILAR method at various thicknesses and annealing temperatures have been carried out in detail and are presented in this book.OmniScriptum SRL, Str. Armeneasca 28/1, office 1, 2012 Chisinau 64 pp. Englisch. Seller Inventory # 9783659258299
Seller Image
SEM, EDAX & AFM study of ZnTe films deposited using SILAR method
Published by
LAP LAMBERT Academic Publishing, 2014
ISBN 10: 3659258296
ISBN 13: 9783659258299
New
Taschenbuch
Seller: preigu, Osnabrück, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. SEM, EDAX & AFM study of ZnTe films deposited using SILAR method | Jignesh Rathod | Taschenbuch | 64 S. | Englisch | 2014 | LAP LAMBERT Academic Publishing | EAN 9783659258299 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. Seller Inventory # 105363225