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Characterization and Modeling of Phase-Change Memories: Case studies in materials exploration, electrical characterization, and device physics - Softcover
Synopsis
Non-Volatile Memory (NVM) technologies play a fundamental role in the semiconductor memory industry. The non-stop increasing of functionalitiesFinal Overview >>and performances of consumer electronic products such as digital cameras, MP3 players, smart-phones, computers, and solid-state hard disks, claims for a continuous improvement of memory capacity and features. However, Flash Memory technology, which plays the major role in the today NVM market, presents intrinsic physical constraints that hamper Flash further scaling. In this context, Phase-Change Memory (PCM) is an emerging NVM technology aiming to replace Flash in many applications. PCM indeed features superior performances, like outstanding scalability perspectives, faster programming, and higher endurance. For these reasons, PCM is a topic of ever increasing interests for the scientific community and for the microelectronics industry. “Characterization and Modeling of Phase-Change Memories” introduces the main features of the PCM technology, and discusses three case studies dealing with key aspects for the further development of advanced PCM, such as new materials, electrical characterizatio, and understanding of device physics.
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About the Author
received the Ph.D. degree in micro- andnanoelectronics from both INP Grenoble, France, and Università degli Studi di Modena and Reggio Emilia, Italy, in 2011. He contributed to the understanding of Phase-Change Memory physics publishing, on this subject, more than 15 papers on international journals and conferences.
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Characterization and Modeling of Phase-Change Memories
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LAP LAMBERT Academic Publishing Aug 2012, 2012
ISBN 10: 3659213780
ISBN 13: 9783659213786
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Non-Volatile Memory (NVM) technologies play a fundamental role in the semiconductor memory industry. The non-stop increasing of functionalitiesFinal Overview and performances of consumer electronic products such as digital cameras, MP3 players, smart-phones, computers, and solid-state hard disks, claims for a continuous improvement of memory capacity and features. However, Flash Memory technology, which plays the major role in the today NVM market, presents intrinsic physical constraints that hamper Flash further scaling. In this context, Phase-Change Memory (PCM) is an emerging NVM technology aiming to replace Flash in many applications. PCM indeed features superior performances, like outstanding scalability perspectives, faster programming, and higher endurance. For these reasons, PCM is a topic of ever increasing interests for the scientific community and for the microelectronics industry. Characterization and Modeling of Phase-Change Memories introduces the main features of the PCM technology, and discusses three case studies dealing with key aspects for the further development of advanced PCM, such as new materials, electrical characterizatio, and understanding of device physics. 92 pp. Englisch. Seller Inventory # 9783659213786
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Characterization and Modeling of Phase-Change Memories
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Characterization and Modeling of Phase-Change Memories
Published by
LAP LAMBERT Academic Publishing Aug 2012, 2012
ISBN 10: 3659213780
ISBN 13: 9783659213786
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Non-Volatile Memory (NVM) technologies play a fundamental role in the semiconductor memory industry. The non-stop increasing of functionalitiesFinal Overview >>and performances of consumer electronic products such as digital cameras, MP3 players, smart-phones, computers, and solid-state hard disks, claims for a continuous improvement of memory capacity and features. However, Flash Memory technology, which plays the major role in the today NVM market, presents intrinsic physical constraints that hamper Flash further scaling. In this context, Phase-Change Memory (PCM) is an emerging NVM technology aiming to replace Flash in many applications. PCM indeed features superior performances, like outstanding scalability perspectives, faster programming, and higher endurance. For these reasons, PCM is a topic of ever increasing interests for the scientific community and for the microelectronics industry. 'Characterization and Modeling of Phase-Change Memories' introduces the main features of the PCM technology, and discusses three case studies dealing with key aspects for the further development of advanced PCM, such as new materials, electrical characterizatio, and understanding of device physics.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 92 pp. Englisch. Seller Inventory # 9783659213786
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Characterization and Modeling of Phase-Change Memories : Case studies in materials exploration, electrical characterization, and device physics
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LAP LAMBERT Academic Publishing, 2012
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Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Non-Volatile Memory (NVM) technologies play a fundamental role in the semiconductor memory industry. The non-stop increasing of functionalitiesFinal Overview and performances of consumer electronic products such as digital cameras, MP3 players, smart-phones, computers, and solid-state hard disks, claims for a continuous improvement of memory capacity and features. However, Flash Memory technology, which plays the major role in the today NVM market, presents intrinsic physical constraints that hamper Flash further scaling. In this context, Phase-Change Memory (PCM) is an emerging NVM technology aiming to replace Flash in many applications. PCM indeed features superior performances, like outstanding scalability perspectives, faster programming, and higher endurance. For these reasons, PCM is a topic of ever increasing interests for the scientific community and for the microelectronics industry. Characterization and Modeling of Phase-Change Memories introduces the main features of the PCM technology, and discusses three case studies dealing with key aspects for the further development of advanced PCM, such as new materials, electrical characterizatio, and understanding of device physics. Seller Inventory # 9783659213786
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Characterization and Modeling of Phase-Change Memories | Case studies in materials exploration, electrical characterization, and device physics
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Taschenbuch. Condition: Neu. Characterization and Modeling of Phase-Change Memories | Case studies in materials exploration, electrical characterization, and device physics | Giovanni Betti Beneventi | Taschenbuch | 92 S. | Englisch | 2014 | LAP LAMBERT Academic Publishing | EAN 9783659213786 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. Seller Inventory # 106313950
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Characterization and Modeling of Phase-Change Memories: Case studies in materials exploration, electrical characterization, and device physics
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