X-Ray Diffraction by Disordered Lamellar Structures: Theory and Applications to Microdivided Silicates and Carbons - Softcover
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New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.
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X-Ray Diffraction by Disordered Lamellar Structures (eng)
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X-Ray Diffraction by Disordered Lamellar Structures
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ISBN 13: 9783642748042
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X-Ray Diffraction by Disordered Lamellar Structures: Theory and Applications to Microdivided Silicates and Carbons
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X-Ray Diffraction by Disordered Lamellar Structures
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable. Seller Inventory # 5069645
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X-Ray Diffraction by Disordered Lamellar Structures: Theory and Applications to Microdivided Silicates and Carbons
Published by
Springer Berlin Heidelberg, 2011
ISBN 10: 364274804X
ISBN 13: 9783642748042
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X-Ray Diffraction by Disordered Lamellar Structures
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ISBN 13: 9783642748042
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 392 pp. Englisch. Seller Inventory # 9783642748042
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X-Ray Diffraction by Disordered Lamellar Structures : Theory and Applications to Microdivided Silicates and Carbons
Published by
Springer Berlin Heidelberg, 2011
ISBN 10: 364274804X
ISBN 13: 9783642748042
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures. Seller Inventory # 9783642748042