Synopsis
This book will be of interest to all those involved in using scanning probe microscopy and will help point the way towards new applications. Of particular interest is the manipulation of single atoms for producing future single-electron devices.
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From the Back Cover
This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.
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Advances in Scanning Probe Microscopy (eng)
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Advances in Scanning Probe Microscopy (Advances in Materials Research)
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Advances in Scanning Probe Microscopy
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Springer Berlin Heidelberg Okt 2012, 2012
ISBN 10: 3642630847
ISBN 13: 9783642630842
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function. 360 pp. Englisch. Seller Inventory # 9783642630842
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Advances in Scanning Probe Microscopy
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ISBN 10: 3642630847
ISBN 13: 9783642630842
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides introduction to selected theoretical and experimental aspects of particular current interest in this rapidly developing fieldOf interest to newcomers and established workers alikeThere have been many books published on scanning tunneling mi. Seller Inventory # 5065417
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Advances in Scanning Probe Microscopy
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Advances in Scanning Probe Microscopy
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Advances in Scanning Probe Microscopy
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Advances in Scanning Probe Microscopy
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Taschenbuch. Condition: Neu. Advances in Scanning Probe Microscopy | T. Sakurai (u. a.) | Taschenbuch | xiv | Englisch | 2012 | Springer | EAN 9783642630842 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. Seller Inventory # 105985926
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Advances in Scanning Probe Microscopy
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ISBN 10: 3642630847
ISBN 13: 9783642630842
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book will be of interest to all those involved in using scanning probe microscopy and will help point the way towards new applications. Of particular interest is the manipulation of single atoms for producing future single-electron devices.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 360 pp. Englisch. Seller Inventory # 9783642630842
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Advances in Scanning Probe Microscopy
Published by
Springer Berlin Heidelberg, 2012
ISBN 10: 3642630847
ISBN 13: 9783642630842
New
Taschenbuch
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function. Seller Inventory # 9783642630842