VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings: 382 (Communications in Computer and Information Science, 382) - Softcover

 
9783642420238: VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings: 382 (Communications in Computer and Information Science, 382)
Softcover
ISBN 10: 3642420230 ISBN 13: 9783642420238
Publisher: Springer, 2013

Synopsis

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

"synopsis" may belong to another edition of this title.

Publisher
Springer
Publication date
2013
Language
English
ISBN 10 
3642420230
ISBN 13 
9783642420238
Binding
Paperback
Number of pages
404
Editor
Gaur Manoj Singh, Zwolinski Mark, Laxmi Vijay, Boolchandani D., Sing Virendra, Singh Adit

Other Popular Editions of the Same Title

9783642420252: VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings

Featured Edition

ISBN 10:  3642420257 ISBN 13:  9783642420252
Publisher: Springer, 2013
Softcover