High-Resolution Imaging and Spectrometry of Materials: 50 (Springer Series in Materials Science, 50) - Softcover
Synopsis
This book is an advanced text on high-resolution electron microscopy. It gives a survey of high-level electron microscopy and its application to surface and interface studies.
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From the Back Cover
This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.
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High-Resolution Imaging and Spectrometry of Materials
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Springer Berlin Heidelberg Dez 2010, 2010
ISBN 10: 3642075258
ISBN 13: 9783642075254
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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science. 456 pp. Englisch. Seller Inventory # 9783642075254
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High-Resolution Imaging and Spectrometry of Materials
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ISBN 10: 3642075258
ISBN 13: 9783642075254
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. In contrast to previously available books this not only reports on the state of the art of advanced electron microscopy but also contains examples of applicationsThe characterisation of materials and material systems is an essential aspect of materials . Seller Inventory # 5046592
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High-Resolution Imaging and Spectrometry of Materials
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High-Resolution Imaging and Spectrometry of Materials
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Taschenbuch. Condition: Neu. High-Resolution Imaging and Spectrometry of Materials | Manfred Rühle (u. a.) | Taschenbuch | xiv | Englisch | 2010 | Springer | EAN 9783642075254 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. Seller Inventory # 107174663
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High-Resolution Imaging and Spectrometry of Materials
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Springer Berlin Heidelberg, Springer Berlin Heidelberg Dez 2010, 2010
ISBN 10: 3642075258
ISBN 13: 9783642075254
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 456 pp. Englisch. Seller Inventory # 9783642075254
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High-Resolution Imaging and Spectrometry of Materials
Published by
Springer Berlin Heidelberg, 2010
ISBN 10: 3642075258
ISBN 13: 9783642075254
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science. Seller Inventory # 9783642075254
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High-Resolution Imaging and Spectrometry of Materials
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Condition: New. Print on Demand pp. xiv + 440 211 Illus. (32 Col.). Seller Inventory # 11290316
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High-Resolution Imaging and Spectrometry of Materials
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Condition: New. PRINT ON DEMAND pp. xiv + 440. Seller Inventory # 1814416153
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High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science)
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Paperback. Condition: Brand New. reprint edition. 454 pages. 9.00x6.00x1.08 inches. In Stock. Seller Inventory # 3642075258
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High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science, 50)
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