Quantitative Measurements of Nano Forces using Atomic Force Microscopy (AFM) - Quantifying Nano Forces in Three-Dimensions using AFM: Applications in the Biological, Physical and Chemical Sciences - Softcover

Watson, Gregory Shaun; Watson, Jolanta A

Softcover

ISBN 10: 3639024613 ISBN 13: 9783639024616

Publisher: VDM Verlag Dr. Mueller E.K., 2008

Synopsis

The atomic force microscope (AFM) was originally utilised for its imaging capabilities. The full potential of the AFM as a three-dimensional force profiling instrument is only now being realised in an increasingly broad range of fields. One of the key requirements for AFM measurements is the quantification of both in-plane and out-of-plane forces acting between the tip and the sample. In this book the procedure for calibration and the various factors to consider when undertaking such studies is outlined with a focus on force-versus-distance and frictional measurements. Examples of surface property analyses, based on the quantification of forces, are shown, with examples ranging from living animal cells to polymeric materials. This book is designed for researchers and students who are interested in carrying out nano scale force measurements in the biological, physical and chemical sciences on a range of systems.

Edition details

• Publisher: VDM Verlag Dr. Mueller E.K.
• Publication date: 2008
• Language: English
• ISBN 10: 3639024613
• ISBN 13: 9783639024616
• Binding: Paperback
• Number of pages: 176