Transmission Electron Microscopy: Physics of Image Formation and Microanalysis: v. 36 (Series in Optical Sciences) - Softcover

Reimer, Ludwig

Softcover

ISBN 10: 3540568492 ISBN 13: 9783540568490

Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 1993

Synopsis

This stuy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of the particle-and wave-optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also analyzed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure determination and the imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. This third edition includes a brief discussion of Schottky emission guns, some clarification of minor details, and references to the recent literature.

Edition details

• Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
• Publication date: 1993
• Language: English
• ISBN 10: 3540568492
• ISBN 13: 9783540568490
• Binding: Paperback
• Edition number: 3
• Number of pages: 545