This introduction to the physics of "Surfaces and Interfaces of Solids" emphasizes both experimental and theoretical aspects of the subject. Beside the techniques of preparing well-defined solid surfaces and interfaces basic models for the description of structural, vibronic and electronic properties of interfaces are described, as well as fundamental aspects of adsorption and layer growth. Because of its importance for modern microelectronics special emphasis is placed on the electronic properties of semiconductor interfaces and heterostructures. Experimental topics covering the basics of ultrahigh-vacuum technology, electron optics, surface spectroscopies and electrical interface characterization techniques are presented in the form of separate panels. This format allows a balanced treatment both of theory and experiment in this highly interdisciplinary field of interface physics. Graduate students and researchers who want to enter or are working in field like surface physics, materials science, semiconductor technology or microelectronics might benefit from the comprehensive treatment of the subject. The author describes, in a comprehensive way, simple models and experimental results of interface physics. Morphology and structure as well as vibronic and electronic properties of solid surfaces and interfaces are discussed. Beside the preparation of well defined surfaces a chapter treats scattering processes which have contributed significantly to the present understanding. Particular emphasis is placed on semiconductor spacecharge layers and heterostructures because of their importance for microelectronics. Experimental techniques are presented in the form of separate panels.
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From the reviews of the fourth edition: "...the author has introduced a novel and very useful pedagogical innovation in order to assist the reader....this volume will surely prove useful for many years and will also survice extensive use... As such it is highly recommended to the reader who wants an in-depth introduction to the physics of surface, interfaces, and thin films." "Very well-organized ... Techniques are presented in detail, in fifteen self-contained panels ... An excellent textbook and handbook." Physicalia "The purpose of this book ... is to provide a unified text for use in surface physics courses. ... the author has introduced a novel and very useful pedagogical innovation in order to assist the reader. Specifically, whereas the main text covers the fundamental physics, fifteen ‘panels’ have been introduced which cover specific topics. ... the publishers have produced a durable volume which is printed on acid-free paper, is well bound, nicely typeset and beautifully illustrated with line drawings and a few well reproduced photographs." (Gary J. Long and Fernande Grandjean, Physicalia, Vol. 38 (5), 2002) "The chapters of this book are devoted to phenomena on solid surfaces, thin films and interfaces. ... the book may be useful to microelectronics and material engineers, to students, and to scientists who are working in the fields of material processes on interfaces." (Oleg A. Sinkevich, Zentralblatt MATH, Vol. 985, 2002)
This book emphasises both experimental and theoretical aspects of surface, interface and thin film physics. Compa- red to the earlier editions, which bore the title "Surfaces and Interfaces of Solid Materials", the book now places more emphasis on thin films, including also their superconducting and ferromagnetic properties. The present 4th edition thus presents techniques of preparing well-defined solid surfaces and interfaces, fundamental aspects of adsorption and layer growth, as well as basic models for the descripti- on of structural, vibronic and electronic properties of sur- faces, interfaces and thin films. Because of their importan- ce for modern information technology, significant attention is paid to the electronic properties of semiconductor inter- faces and heterostructures. Collective phenomena , such as superconductivity and ferromagnetism, also feature promi- nently. Experimental sections covering essential measurement and preparation techniques are presented in separate panels.
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