Defect Complexes in Semiconductor Structures: Proceedings of the International School Held in Mátrafüred, Hungary, September 13 – 17, 1982: 175 (Lecture Notes in Physics, 175) - Softcover
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Defect Complexes in Semiconductor Structures: Proceedings of the International School Held in Matrafa1/4red, Hungary, September 13-17, 1982
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Defect complexes in semiconductor structures. Proceedings of the international school held in Mátrafüred Hungary September 13 - 17 1982.
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Softcover. Ex-library in GOOD condition with library-signature and stamp(s). Some traces of use. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. C-00465 3540119868 Sprache: Englisch Gewicht in Gramm: 550. Seller Inventory # 2482979
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Defect Complexes in Semiconductor Structures. Proceedings of the International School Held in Mátrafüred, Hungary September 13-17, 1982.
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Berlin, Springer Berlin Heidelberg, 1983
ISBN 10: 3540119868
ISBN 13: 9783540119869
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Seller: Antiquariat Bookfarm, Löbnitz, Germany
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Softcover. 311 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library with stamp and library-signature. GOOD condition, some traces of use. 3540119868 Sprache: Englisch Gewicht in Gramm: 550. Seller Inventory # 2341026
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Defect Complexes in Semiconductor Structures: Proceedings of the International School Held in Mátrafüred, Hungary, September 13 - 17, 1982 (Lecture Notes in Physics, 175)
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Defect Complexes in Semiconductor Structures: Proceedings of the International School Held in Mátrafüred, Hungary, September 13 - 17, 1982 (Lecture Notes in Physics, 175)
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Defect Complexes in Semiconductor Structures
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Springer, Springer Berlin Heidelberg Feb 1983, 1983
ISBN 10: 3540119868
ISBN 13: 9783540119869
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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -A technologist's view on defects.- Characterization of impurities and defects by electron paramagnetic resonance and related techniques.- Review of the possibilities of electron microscopy in the identification of defect structures.- Electrical and optical measuring techniques for flaw states.- Theory of defect complexes.- Critical comparison of the theoretical models for anomalous large lattice relaxation in III-V compounds.- Vacancy related structure defects in SiO2 - Cyclic cluster calculations compared with experimental results.- A new model for the Si-A center.- Defect complexing in iron-doped silicon.- Photoluminescence of defect complexes in silicon.- Electron microscopical analysis of the stacking fault behaviour in inert-gas annealed Czochralski silicon.- Oxygen precipitation and the generation of secondary defects in oxygen-rich silicon.- Electrical and optical properties of oxygen-related donors in silicon formed at temperatures from 600 to 850 °c.- On the field dependence of capture and emission processes at deep centres.- Lattice matched heterolayers.- Compositional transition layers in heterostructure.- Defect complexes in III-V compounds.- Low frequency current oscillations due to electron retrapping by the AsGa antisite defect in GaAs.- Main electron traps in gaas: Aggregates of antisite defects.- Defect reactions in gap caused by zinc diffusion.- Nonstatistical defect surroundings in mixed crystals - the selfactivated luminescence centre in ZnSxSe1-x.- Structure and properties of the Si-SiO2 interregion.- Radiation defects of the semiconductor-insulator interface.- Analysis of Si/SiO2 interface defects by the method of term spectroscopy.- Theoretical aspects of laser annealing.- Radiation methods for creation of heterostructures on silicon.-Ion beam gettering in GaP.- Panel discussion.- Mechanical stress induced defect creation in GaP. 320 pp. Englisch. Seller Inventory # 9783540119869
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Defect Complexes in Semiconductor Structures
Published by
Springer Berlin Heidelberg, 1983
ISBN 10: 3540119868
ISBN 13: 9783540119869
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. A technologist s view on defects.- Characterization of impurities and defects by electron paramagnetic resonance and related techniques.- Review of the possibilities of electron microscopy in the identification of defect structures.- Electrical and optical . Seller Inventory # 4881624
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Defect Complexes in Semiconductor Structures
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Condition: New. pp. 320. Seller Inventory # 264661364
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Defect Complexes in Semiconductor Structures
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Condition: New. Print on Demand pp. 320 67:B&W 6.69 x 9.61 in or 244 x 170 mm (Pinched Crown) Perfect Bound on White w/Gloss Lam. Seller Inventory # 3186603
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Defect Complexes in Semiconductor Structures: Proceedings of the International School Held in Mátrafuered, Hungary, September 13 17, 1982 (Lecture Notes in Physics)
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Paperback. Condition: Brand New. spiral-bound edition. 317 pages. 9.61x6.70x0.73 inches. In Stock. Seller Inventory # x-3540119868
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Defect Complexes in Semiconductor Structures
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Condition: New. PRINT ON DEMAND pp. 320. Seller Inventory # 184661374