Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis - Hardcover

Magonov, Sergei N.; Whangbo, Myung–Hwan

Hardcover

ISBN 10: 3527293132 ISBN 13: 9783527293131

Publisher: Wiley VCH, 1996

Synopsis

This text discusses the interplay between calculated surface plots and experimentally obtained images. A rational interpretation of the high-resolution features of experimentally obtained atomic scale images is essential for the application of STM and AFM for surface analysis.

About this title

From the Back Cover

Sergei N. Magonov, Myung-Hwan Whangbo Surface Analysis with STM and AFM Experimental and Theoretical Aspects of Image Analysis Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to a lack of the proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical image analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip force induced surface corrugations. Practical examples are taken from:

• inorganic layered materials
• organic conductors
• organic adsorbates at liquid ? solid interfaces
• self-assembled amphiphiles
• polymers

This book will be an invaluable reference work for researchers active in STM and AFM as well as for newcomers to the field.

Edition details

• Publisher: Wiley VCH
• Publication date: 1996
• Language: English
• ISBN 10: 3527293132
• ISBN 13: 9783527293131
• Binding: Hardcover
• Number of pages: 335