Items related to A Novel LVSD Design and its Robustness to Process Variation...
A Novel LVSD Design and its Robustness to Process Variation Effects: Low Power and Robust Techniques for CMOS Circuits - Softcover
Synopsis
Due to the aggressive scaling in the IC design, interconnect delay has adversely been affected, which subsequently reduces the performance. This problem can be mitigated by employing line drivers but they have high power consumption. Low-swing signalling techniques can provide high-speed signalling with low-power consumption, and most schemes are immune to noise as they have good signal-to-noise-ratio (SNR). However, they tend to have large area penalty and complexity as they require additional circuitry. A diode-connected driver circuit has the best attributes over other drivers in terms of low power, low delay, good SNR and low area-overhead. By incorporating a diode-connected configuration at the output, it can provide a high-speed signalling due to its high-driving capability. However, this configuration also has its limitations due to its inept adaptability to process variations, as well as leakage currents. To address these limitations, two novel driver schemes have been designed, where they have significant improvement in terms of delay, power consumption, noise and robustness against PVT effect and external disturbances such as crosstalk and single-event-upsets.
"synopsis" may belong to another edition of this title.
About the Author
Nor M. Muzlifah received B.Eng. degree in Electric-Telecommunication from Universiti Teknologi Malaysia, in 2005; M.Sc. degree in Electronics System Design Engineering from Universiti Sains Malaysia, in 2006; and a Ph.D. degree in Microelectronics System Design from Newcastle University, UK in 2011. She is currently an IEEE and IET member.
"About this title" may belong to another edition of this title.
Search results for A Novel LVSD Design and its Robustness to Process Variation...
Seller Image
A Novel LVSD Design and its Robustness to Process Variation Effects
Published by
LAP LAMBERT Academic Publishing Feb 2017, 2017
ISBN 10: 3330032464
ISBN 13: 9783330032460
New
Taschenbuch
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Due to the aggressive scaling in the IC design, interconnect delay has adversely been affected, which subsequently reduces the performance. This problem can be mitigated by employing line drivers but they have high power consumption. Low-swing signalling techniques can provide high-speed signalling with low-power consumption, and most schemes are immune to noise as they have good signal-to-noise-ratio (SNR). However, they tend to have large area penalty and complexity as they require additional circuitry. A diode-connected driver circuit has the best attributes over other drivers in terms of low power, low delay, good SNR and low area-overhead. By incorporating a diode-connected configuration at the output, it can provide a high-speed signalling due to its high-driving capability. However, this configuration also has its limitations due to its inept adaptability to process variations, as well as leakage currents. To address these limitations, two novel driver schemes have been designed, where they have significant improvement in terms of delay, power consumption, noise and robustness against PVT effect and external disturbances such as crosstalk and single-event-upsets. 220 pp. Englisch. Seller Inventory # 9783330032460
Seller Image
A Novel LVSD Design and its Robustness to Process Variation Effects
Published by
LAP LAMBERT Academic Publishing, 2017
ISBN 10: 3330032464
ISBN 13: 9783330032460
New
Softcover
Seller: moluna, Greven, Germany
Seller rating 5 out of 5 stars
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Mahyuddin Nor MuzlifahNor M. Muzlifah received B.Eng. degree in Electric-Telecommunication from Universiti Teknologi Malaysia, in 2005 M.Sc. degree in Electronics System Design Engineering from Universiti Sains Malaysia, in 2006 an. Seller Inventory # 158421925
Buy New
£ 49.44
£ 41.52 shipping
Ships from Germany to U.S.A.
Ships from Germany to U.S.A.
Quantity: Over 20 available
Stock Image
A Novel LVSD Design and its Robustness to Process Variation Effects: Low Power and Robust Techniques for CMOS Circuits
Published by
LAP LAMBERT Academic Publishing, 2017
ISBN 10: 3330032464
ISBN 13: 9783330032460
New
Softcover
Seller: Books Puddle, Woodside, NY, U.S.A.
Seller rating 4 out of 5 stars
Condition: New. Seller Inventory # 26394682600
Stock Image
A Novel LVSD Design and its Robustness to Process Variation Effects: Low Power and Robust Techniques for CMOS Circuits
Published by
LAP LAMBERT Academic Publishing, 2017
ISBN 10: 3330032464
ISBN 13: 9783330032460
New
Paperback
Seller: Revaluation Books, Exeter, United Kingdom
Seller rating 5 out of 5 stars
Paperback. Condition: Brand New. 01 edition. 220 pages. 8.66x5.91x0.50 inches. In Stock. Seller Inventory # 3330032464
Buy New
£ 92.98
£ 10 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: 1 available
Stock Image
A Novel LVSD Design and its Robustness to Process Variation Effects: Low Power and Robust Techniques for CMOS Circuits
Published by
LAP LAMBERT Academic Publishing, 2017
ISBN 10: 3330032464
ISBN 13: 9783330032460
New
Softcover
Seller: Majestic Books, Hounslow, United Kingdom
Seller rating 4 out of 5 stars
Condition: New. Print on Demand. Seller Inventory # 401727287
Buy New
£ 97.42
£ 6.50 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: 4 available
Stock Image
A Novel LVSD Design and its Robustness to Process Variation Effects: Low Power and Robust Techniques for CMOS Circuits
Published by
LAP LAMBERT Academic Publishing, 2017
ISBN 10: 3330032464
ISBN 13: 9783330032460
New
Softcover
Seller: Biblios, Frankfurt am main, HESSE, Germany
Seller rating 4 out of 5 stars
Condition: New. PRINT ON DEMAND. Seller Inventory # 18394682594
Seller Image
A Novel LVSD Design and its Robustness to Process Variation Effects
Published by
LAP LAMBERT Academic Publishing Feb 2017, 2017
ISBN 10: 3330032464
ISBN 13: 9783330032460
New
Taschenbuch
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Due to the aggressive scaling in the IC design, interconnect delay has adversely been affected, which subsequently reduces the performance. This problem can be mitigated by employing line drivers but they have high power consumption. Low-swing signalling techniques can provide high-speed signalling with low-power consumption, and most schemes are immune to noise as they have good signal-to-noise-ratio (SNR). However, they tend to have large area penalty and complexity as they require additional circuitry. A diode-connected driver circuit has the best attributes over other drivers in terms of low power, low delay, good SNR and low area-overhead. By incorporating a diode-connected configuration at the output, it can provide a high-speed signalling due to its high-driving capability. However, this configuration also has its limitations due to its inept adaptability to process variations, as well as leakage currents. To address these limitations, two novel driver schemes have been designed, where they have significant improvement in terms of delay, power consumption, noise and robustness against PVT effect and external disturbances such as crosstalk and single-event-upsets.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 220 pp. Englisch. Seller Inventory # 9783330032460
Seller Image
A Novel LVSD Design and its Robustness to Process Variation Effects : Low Power and Robust Techniques for CMOS Circuits
Published by
LAP LAMBERT Academic Publishing, 2017
ISBN 10: 3330032464
ISBN 13: 9783330032460
New
Taschenbuch
Seller: AHA-BUCH GmbH, Einbeck, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Due to the aggressive scaling in the IC design, interconnect delay has adversely been affected, which subsequently reduces the performance. This problem can be mitigated by employing line drivers but they have high power consumption. Low-swing signalling techniques can provide high-speed signalling with low-power consumption, and most schemes are immune to noise as they have good signal-to-noise-ratio (SNR). However, they tend to have large area penalty and complexity as they require additional circuitry. A diode-connected driver circuit has the best attributes over other drivers in terms of low power, low delay, good SNR and low area-overhead. By incorporating a diode-connected configuration at the output, it can provide a high-speed signalling due to its high-driving capability. However, this configuration also has its limitations due to its inept adaptability to process variations, as well as leakage currents. To address these limitations, two novel driver schemes have been designed, where they have significant improvement in terms of delay, power consumption, noise and robustness against PVT effect and external disturbances such as crosstalk and single-event-upsets. Seller Inventory # 9783330032460
Stock Image
A Novel LVSD Design and its Robustness to Process Variation Effects: Low Power and Robust Techniques for CMOS Circuits
Published by
LAP LAMBERT Academic Publishing, 2017
ISBN 10: 3330032464
ISBN 13: 9783330032460
New
paperback
Seller: Mispah books, Redhill, SURRE, United Kingdom
Seller rating 4 out of 5 stars
paperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book. Seller Inventory # ERICA82933300324646