Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry - Softcover

Softcover

ISBN 10: 3319799886 ISBN 13: 9783319799889

Publisher: Springer, 2018

Synopsis

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging―the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science

Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

About this title

About the Author

C. Barry Carter is the Editor-in-Chief of the Journal of Materials Science and a CINT Distinguished Affiliate Scientist. He teaches at UConn.

David B. Williams is the Monte Ahuja Endowed Dean’s Chair, Executive Dean of The Professional Colleges and Dean of the College of Engineering at The Ohio State University.

Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Praise for Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter:

“The best textbook for this audience available.” ― American Scientist

“...highly readable, and an extremely valuable text for all users of the TEM at every level. Treat yourself to a copy!” ― Microscopy and Microanalysis

“This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.” ― Micron

“The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.” ― MRS Bulletin

“It is truly a book so thoughtfully written that … it will provide a solid foundation for those studying material science….an outstanding book.” ― IEEE Electrical Insulation Magazine, Vol. 26 (4), July/August, 2010

Edition details

• Publisher: Springer
• Publication date: 2018
• Language: English
• ISBN 10: 3319799886
• ISBN 13: 9783319799889
• Binding: Paperback
• Number of pages: 551
• Editor: Carter C. Barry, Williams David B.