Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM - Hardcover

Egerton, R.F.

Hardcover

ISBN 10: 3319398768 ISBN 13: 9783319398761

Publisher: Springer, 2016

Synopsis

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

About this title

Review

From the reviews:

"This book comprises a concise introduction to the fundamental physical concepts of electron microscopy and related analytical techniques ... . The concepts are well explained and illustrated, and in addition, the author offers a helpful introduction to microscopy, as a whole ... . The text includes interesting historical tidbits and also alludes to more recent developments ... . It is suitable for institutional or personal purchase." (Andreas Holzenburg, Microbiology Today, July, 2006)

"R.F. Egerton ... has now written a short book for beginners on electron microscopy in general: Physical Principles of Electron Microscopy, an Introduction to TEM, SEM, and AEM[10]. ... Extremely simple language is used throughout and newcomers to the subject will be grateful for this text, designed to accompany a one-semester undergraduate course." (P. W. Hawkes, Ultramicroscopy, Vol. 107 (54), 2007)

From the Back Cover

This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.
Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.

Edition details

• Publisher: Springer
• Publication date: 2016
• ISBN 10: 3319398768
• ISBN 13: 9783319398761
• Binding: Hardcover
• Language: English
• Edition number: 2
• Number of pages: 207