Synopsis
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. Current instrumentation provides a powerful combination of capabilities for molecular detection and trace element determination, imaging and microanalysis, and shallow depth profiling. This is the first book to be dedicated to the subject and the treatment is comprehensive. Following overview and historical chapters, there are sections devoted to: instrumentation and sample handling (three chapters); fundamentals and molecular dynamics simulations (four chapters); optimisation methods, including laser post-ionisation of sputtered neutrals (six chapters); data interpretation (two chapters), and analytical applications (eleven chapters). All the contributors are internationally recognised as leaders in their respective fields and come from both Europe and the USA.
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ToF-SIMS: Surface Analysis by Mass Spectrometry
Seller: Anybook.com, Lincoln, United Kingdom
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Condition: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1800grams, ISBN:9781901019032. Seller Inventory # 4319102
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