Reliability and Materials Issues of III–V and II–VI Semiconductor Optical and Electron Devices and Materials II: Volume 1432 (MRS Proceedings) - Hardcover

Hardcover

ISBN 10: 160511409X ISBN 13: 9781605114095

Publisher: Materials Research Society, 2012

Synopsis

Symposium G, 'Reliability and Materials Issues of III–V and II–VI Semiconductor Optical and Electron Devices and Materials II', was held April 9–13 at the 2012 MRS Spring Meeting in San Francisco, California. Achieving high reliability is a key issue for semiconductor optical and electrical devices and is as important as device performance for commercial application. Degradation of both optical and electrical devices is strongly related to the materials issues. A variety of material defects can occur during the device fabrication processes, i.e., crystal growth, impurity diffusion, ion-implantation, wet/dry etching, metallisation, bonding, packaging, etc. This symposium presented state-of-the-art results on reliability and degradation of various semiconductor optical and electrical devices as well as their materials issues in thin-film growth, wafer processing and device fabrication processes.

About this title

Book Description

Symposium G, 'Reliability and Materials Issues of III–V and II–VI Semiconductor Optical and Electron Devices and Materials II', was held April 9–13 at the 2012 MRS Spring Meeting. This symposium presented state-of-the-art results on reliability and degradation of various semiconductor optical and electrical devices.

Edition details

• Publisher: Materials Research Society
• Publication date: 2012
• Language: English
• ISBN 10: 160511409X
• ISBN 13: 9781605114095
• Binding: Hardcover
• Number of pages: 212
• Editor: Ueda Osamu, Fukuda Mitsuo, Shiojima Kenji, Piner Edwin