Synopsis
Excerpt from Optical Detector Nonlinearity, Simulation
We have developed a unified mathematical treatment for five commonly used methods of measuring optical detector nonlinearity. We performed computer simulations to compare these methods for different measurement conditions and data processing options. The triplet and differential methods gave the best overall results, and third and fourth-order polynomial representations of the measurement results will yield the least total error for a common practical measurement system.
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Paperback. Condition: New. Print on Demand. This book is an essential resource for optoelectronic engineers and researchers, seeking a unified mathematical treatment for accurately measuring optical detector nonlinearity. It presents a comprehensive overview of nonlinearity measurement methods, delving into their advantages, disadvantages, and accuracies, enabling the reader to choose the most suitable method for their specific needs. Through computer simulations, the author analyzes key issues, including data uncertainties, error types, and polynomial order, to guide the reader in optimizing measurement system design and data processing for achieving desired accuracy. The book's insights enhance understanding of detector nonlinearity measurement and its impact on optical radiation measurements, providing valuable knowledge for improving the accuracy and reliability of optoelectronic systems. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Seller Inventory # 9781528528405_0
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9781528528405
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