Synopsis
Explore how scanning and spectroscopy come together to map where elements live on a microscopic scale. This reference explains how the electron probe, combined with x-ray spectrometry and scanning techniques, can reveal both the composition and distribution of elements within a specimen. It covers the theory, instrument design, and practical imaging methods that make the device a powerful tool for materials research.
The book describes how a scanning electron probe can function as a microscope sensitive to elemental composition. It shows how different signals—x-rays, target current, backscattered electrons, and cathodoluminescence—can form images and quantitative maps. Readers will learn about pulse recording, expanded contrast, and concentration mapping, as well as how to balance resolution, sensitivity, and background noise. The material emphasizes applying these techniques to real-world samples, from metals to minerals, while noting practical considerations like surface preparation and instrument stability.
- How x-ray emission is used to determine local composition and how image contrast can be enhanced.
- Techniques for turning photon arrivals into quantitative maps of element concentrations.
- How to combine multiple signals and imaging modes to visualize distribution and structure.
- Practical guidance on scan strategies, noise management, and instrument stability for reliable results.
Ideal for researchers and students who need a solid, practical foundation in scanning electron probe microanalysis and its imaging options.
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Scanning Electron Probe Microanalysis (Classic Reprint)
Print on DemandSeller: Forgotten Books, London, United Kingdom
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Paperback. Condition: New. Print on Demand. This book is a valuable resource for those working with and wanting to learn more about scanning electron probe microanalysis. The author, a specialist in the field, explains the fundamental principles of the method and reviews the practical aspects of electron probe instruments. He offers detailed discussion on the use of scanning techniques in electron probe microanalysis, with the book including a variety of images to illustrate applications. This book is an essential guide for scientists and researchers using electron probe microanalysis and for those interested in learning more about this advanced analytical technique. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Seller Inventory # 9781528028370_0
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Scanning Electron Probe Microanalysis (Classic Reprint)
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9781528028370
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Scanning Electron Probe Microanalysis (Classic Reprint)
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9781528028370
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