Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, January 1 to March 31, 1973 (Classic Reprint) - Softcover
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Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, January 1 to March 31, 1973
Through Research and Technical Services Cost Centers 4251126, 4252128, 4254115, 4251140, and 4254140.
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Methods of Measurement for Semiconductor Materials, Process Control, and
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Paperback. Condition: New. Print on Demand. This book offers a rich exploration of semiconductor materials, process control, and devices. It features research on resistivity, methods of measurement for semiconductor materials, and quality management in device fabrication processes. The author skillfully presents insights into the detection and counting of impurity and defect centers in semiconductors. Significantly, this book contributes to the understanding of gold-doped silicon, providing valuable knowledge for researchers working on semiconductor devices. The author's study of infrared response techniques adds to the understanding of energy levels in semiconductor materials and their impact on device performance. Overall, this book is a valuable resource for engineers, scientists, and anyone interested in the field of semiconductor research and development. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Seller Inventory # 9781528028332_0
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9781528028332
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9781528028332
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