Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, July 1 to September 30, 1969 (Classic Reprint) - Softcover
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Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, July 1 to September 30, 1969
Additional background information on the Program and individual tasks may be found in earlier reports in this series (see Appendix D).
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Methods of Measurement for Semiconductor Materials, Process Control, and
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Paperback. Condition: New. Print on Demand. This book is a technical report that focuses on the measurement of the properties of metals, processes for producing semiconductors, and the devices made from those materials. The book itself is a report on research and development efforts related to those measurements. The main goal of the work is to improve the performance, interchangeability, and reliability of discrete semiconductor devices and integrated circuits through improvements in methods of measurement for use in specifying materials and devices, and in the control of device fabrication processes, for which the findings from this book will contribute. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Seller Inventory # 9781527914292_0
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices Quarterly Report, July 1 to September 30, 1969 Classic Reprint
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices Quarterly Report, July 1 to September 30, 1969 Classic Reprint
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