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Synopsis
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.
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About the Author
Manjul Bhushan is a technical consultant in New York.
Mark Ketchen is a technical consultant in Massachusetts.
From the Back Cover
This book extends test structure applications described in Microelectronic Test Structures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters.
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CMOS Test and Evaluation
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Condition: Muy bueno. : CMOS Test and Evaluation: A Physical Perspective es un libro de Manjul Bhushan y Mark B. Ketchen, publicado por Springer. El libro tiene 424 páginas y está disponible en formato de tapa dura. EAN: 9781493913480 Tipo: Libros Categoría: Tecnología Título: CMOS Test and Evaluation Autor: Manjul Bhushan| Mark B. Ketchen Páginas: 424 Formato: tapa dura. Seller Inventory # Happ-2026-07-02-59adb603
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CMOS Test and Evaluation: A Physical Perspective
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CMOS Test and Evaluation
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CMOS Test and Evaluation: A Physical Perspective
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CMOS Test and Evaluation: A Physical Perspective (eng)
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CMOS Test and Evaluation
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Relates CMOS product performance to basic physical models of transistors and passive elementsUses embedded test structures and sensors for product test debug, yield and performance evaluationDescribes impact of device variabilityDisc. Seller Inventory # 4214097
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CMOS Test and Evaluation
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Springer New York, Chapman And Hall/CRC Dez 2014, 2014
ISBN 10: 1493913484
ISBN 13: 9781493913480
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range. 440 pp. Englisch. Seller Inventory # 9781493913480
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CMOS Test and Evaluation
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Springer New York, Springer US Dez 2014, 2014
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Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 440 pp. Englisch. Seller Inventory # 9781493913480
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CMOS Test and Evaluation: A Physical Perspective
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CMOS Test and Evaluation : A Physical Perspective
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ISBN 10: 1493913484
ISBN 13: 9781493913480
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range. Seller Inventory # 9781493913480