Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip - Softcover

Onabajo, Marvin; Silva-Martinez, Jose

Softcover

ISBN 10: 1489992960 ISBN 13: 9781489992963

Publisher: Springer, 2014

Synopsis

This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements.

• Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;
• Includes built-in testing techniques, linked to current industrial trends;
• Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;
• Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.

About this title

From the Back Cover

This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements.

• Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;
• Includes built-in testing techniques, linked to current industrial trends;
• Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;
• Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.

Edition details

• Publisher: Springer
• Publication date: 2014
• Language: English
• ISBN 10: 1489992960
• ISBN 13: 9781489992963
• Binding: Paperback
• Number of pages: 192