A practical guide to introducing into the manufacturing process a system for verifying the resistance, capacitive and inductive reactance, and other parameters of individual components of an electronic circuit that has already been assembled. Provides advice on the available equipment, what the technique can and cannot do, the benefits and drawbacks, programming, interfacing, fault finding, and other aspects. For engineers and technicians considering or implementing such a system. Annotation copyright Book News, Inc. Portland, Or.
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A practical guide to in-circuit test (ICT) equipment that provides a selection guide and advice on how to get the most from ICT technology for most applications. Common problems are highlighted and solutions are provided. This book is written from user's perspective, and offers a running start to engineers considering or implementing in-circuit testing. Chapters are de voted to applications, such as fitting ICT into a typical test strategy and into the manufacturing environment, and to business aspects, such as the purchase decision - choice of system, initial and ongoing costs, and preparation of the financial proposal to management. Programming, interfacing and fault finding are all described in detail, and design for ICT is also considered. Allen Buckroyd has also written "Computer Integrated Testing".
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