Atomic Force Microscopy/Scanning Tunneling Microscopy 2 - Softcover

Softcover

ISBN 10: 147579326X ISBN 13: 9781475793260

Publisher: Springer, 2013

Synopsis

Keynote Address: Scanned Probe Microscopy; M.F. Crommie. Semiconductor Characterization and Adsorbate Characterization: Scanning Tunneling Microscopy for Very Large-Scale Integration (VLSI) Inspection; S.Y. Hong. Scanning Tunneling Microscopy-based Fabrication of Nanometer Scale Structures; M.H. Nayfeh. Biological and Chemical Nanostructure: Visualization of the Surface Degradation of Biomedical Polymers in Situ with an Atomic Force Microscope; K.M. Shakesheff, et al. Scanning Tunneling Microscopy Investigations on Heteroepitaxially Grown Overlayers of Cu-phthalocyanine On Au(111) Surfaces; T. Fritz, et al. New Developments in AFM/STM: Investigations on the Topographic and Spectroscopic Imaging by the Scanning Tunneling Microscope; M. Hietschold, et al. Observing Reactions via Flow Injection Scanning Tunneling Microscopy; J.D. Noll, et al. AFM/STM in Materials Science: Applications of Atomic Force Microscopy in Optical Fiber Research; Q. Zhong, D. Inniss. Atomic Force Microscopy Studies on Optical Fibers; M.J. Matthewson, et al. 19 additional articles. Index.

Edition details

• Publisher: Springer
• Publication date: 2013
• Language: English
• ISBN 10: 147579326X
• ISBN 13: 9781475793260
• Binding: Paperback
• Number of pages: 264
• Editor: Cohen Samuel H., Lightbody Marcia L.