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Advanced Scanning Electron Microscopy and X-Ray Microanalysis - Softcover

 
9781475790283: Advanced Scanning Electron Microscopy and X-Ray Microanalysis

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Synopsis

1. Modeling Electron Beam-Specimen Interactions.- 2. SEM Microcharacterization of Semiconductors.- 3. Electron Channeling Contrast in the SEM.- 4. Magnetic Contrast in the SEM.- 5. Computer-Aided Imaging and Interpretation.- 6. Alternative Microanalytical Techniques.- 7. Specimen Coating.- 8. Advances in Specimen Preparation for Biological SEM.- 9. Cryomicroscopy.- References.

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  • PublisherSpringer
  • Publication date2013
  • ISBN 10 1475790287
  • ISBN 13 9781475790283
  • BindingPaperback
  • LanguageEnglish
  • Number of pages476

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Other Popular Editions of the Same Title

9780306421402: Advanced Scanning Electron Microscopy and X-Ray Microanalysis

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ISBN 10:  0306421402 ISBN 13:  9780306421402
Publisher: Springer, 1986
Hardcover