Advanced Scanning Electron Microscopy and X-Ray Microanalysis - Softcover

Echlin, Patrick; Fiori, C.E.; Goldstein, Joseph

 
9781475790283: Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Softcover
ISBN 10: 1475790287 ISBN 13: 9781475790283
Publisher: Springer, 2013

This specific ISBN edition is currently not available.

Synopsis

1. Modeling Electron Beam-Specimen Interactions.- 2. SEM Microcharacterization of Semiconductors.- 3. Electron Channeling Contrast in the SEM.- 4. Magnetic Contrast in the SEM.- 5. Computer-Aided Imaging and Interpretation.- 6. Alternative Microanalytical Techniques.- 7. Specimen Coating.- 8. Advances in Specimen Preparation for Biological SEM.- 9. Cryomicroscopy.- References.

"synopsis" may belong to another edition of this title.

Publisher
Springer
Publication date
2013
Language
English
ISBN 10 
1475790287
ISBN 13 
9781475790283
Binding
Paperback
Number of pages
476

Other Popular Editions of the Same Title

9780306421402: Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Featured Edition

ISBN 10:  0306421402 ISBN 13:  9780306421402
Publisher: Springer, 1986
Hardcover