Items related to Yield Simulation for Integrated Circuits

Yield Simulation for Integrated Circuits - Softcover

Walker, D.M.

 
9781475719321: Yield Simulation for Integrated Circuits
Softcover
ISBN 10: 1475719329 ISBN 13: 9781475719321
Publisher: Springer, 2013

This specific ISBN edition is currently not available.

Synopsis

1. Introduction.- 2. Background.- 3. Defect Models.- 4. Defect Statistics.- 5. Fault Analysis.- 6. VLASIC Implementation.- 7. Redundancy Analysis System.- 8. Fabrication Data.- 9. Conclusions and Current Research.- References.

"synopsis" may belong to another edition of this title.

Publisher
Springer
Publication date
2013
Language
English
ISBN 10 
1475719329
ISBN 13 
9781475719321
Binding
Paperback

(No Available Copies)

Search Books:



Create a Want

Can't find the book you're looking for? We'll keep searching for you. If one of our booksellers adds it to AbeBooks, we'll let you know!

Create a Want

Other Popular Editions of the Same Title

9780898382440: Yield Simulation for Integrated Circuits: 33 (The Springer International Series in Engineering and Computer Science, 33)

Featured Edition

ISBN 10:  0898382440 ISBN 13:  9780898382440
Publisher: Springer, 1987
Hardcover