Surface and Interface Characterization by Electron Optical Methods - Softcover

 
9781461595380: Surface and Interface Characterization by Electron Optical Methods

This specific ISBN edition is currently not available.

Synopsis

Principles and techniques of transmission imaging of surfaces.- Catalyst studies by scanning transmission electron microscopy.- Localised surface imaging and spectroscopy in the scanning transmission electron microscope.- Fundamentals of high resolution transmission electron microscopy.- Profile imaging of small particles, extended surfaces and dynamic surface phenomena.- Transmission electron microscopy and diffraction from semiconductor interfaces and surfaces.- The transmission electron microscopy of interfaces and multilayers.- Surface microanalysis and microscopy by X-ray photoelectron spectroscopy (XPS), core-loss spectroscopy (CLS) and Auger electron spectroscopy (AES).- Reflection electron microscopy.- An introduction to reflection high energy electron diffraction.- Intensity oscillations in reflection high energy electron diffraction during epitaxial growth.- Emission and low energy reflection electron microscopy.- Scanning tunneling microscopy and spectroscopy.- Spin-polarized secondary electrons from ferromagnets.- Electronically stimulated desorption: mechanisms, applications and implications.- Structure and catalytic activity of surfaces.

"synopsis" may belong to another edition of this title.

Other Popular Editions of the Same Title

9781461595397: Surface and Interface Characterization by Electron Optical Methods: 16 (Nato ASI Subseries B:, 16)

Featured Edition

ISBN 10:  1461595398 ISBN 13:  9781461595397
Publisher: Springer, 2012
Softcover