Hierarchical Modeling for VLSI Circuit Testing - Softcover

Bhattacharya, Debashis; Hayes, John P.

 
9781461315285: Hierarchical Modeling for VLSI Circuit Testing

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9780792390589: Hierarchical Modeling for VLSI Circuit Testing: 89 (The Springer International Series in Engineering and Computer Science, 89)

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ISBN 10:  079239058X ISBN 13:  9780792390589
Publisher: Springer, 1989
Hardcover