Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach - Softcover

Laurila, Tomi; Vuorinen, Vesa; Paulasto-Kröckel, Mervi

 
9781447124719: Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach

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Synopsis

Introduction: Away from trial and error methods.- Materials and interfaces in Microsystems.- Introduction to mechanics of materials.- Introduction to thermodynamic-kinetic method.- Interfacial adhesion in polymer systems.- Evolution of different types of interfacial structures.

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Other Popular Editions of the Same Title

9781447124696: Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach (Microsystems)

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ISBN 10:  1447124693 ISBN 13:  9781447124696
Publisher: Springer, 2012
Hardcover