Items related to Nanoscale Memory Repair (Integrated Circuits and Systems)

Nanoscale Memory Repair (Integrated Circuits and Systems) - Hardcover

Book 27 of 34: Integrated Circuits and Systems

Horiguchi, Masashi; Itoh, Kiyoo

 
9781441979575: Nanoscale Memory Repair (Integrated Circuits and Systems)
Hardcover
ISBN 10: 1441979573 ISBN 13: 9781441979575
Publisher: Springer, 2011

Synopsis

Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.

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From the Back Cover

Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. As a result, repair techniques have been indispensable for nano-scale memories. Without these techniques, even modern MPUs/ SoCs, in which memories have dominated the area and performance, could not have been designed successfully.

This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.

  • Presents the first comprehensive reference to reliability and repair techniques for nano-scale memories;
  • Covers both the mathematical foundations and engineering applications of yield and reliability in nano-scale memories;
  • Includes a variety of practical circuits and logic, critical for higher yield and reliability, which have been proven successful during the authors’ extensive experience in developing memories and low-voltage CMOS circuits.


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Publisher
Springer
Publication date
2011
Language
English
ISBN 10 
1441979573
ISBN 13 
9781441979575
Binding
Hardcover
Number of pages
228