Measuring Success – Testing, Grades, and the Future of College Admissions - Hardcover

Buckley, Jack; Letukas, Lynn; Wildavsky, Ben

 
9781421424965: Measuring Success – Testing, Grades, and the Future of College Admissions

Synopsis

Standardized tests have become the gateway to higher education . . . but should they be?

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About the Authors

Jack Buckley is the senior vice president of research and evaluation at the American Institutes for Research and a research associate professor of applied statistics at New York University. He is the coauthor of Charter Schools: Hope or Hype?

Lynn Letukas is an associate research scientist at the College Board. She is the author of Primetime Pundits: How Cable News Covers Social Issues.

Ben Wildavsky is senior fellow and executive director at the College Board Policy Center. He is the author of The Great Brain Race: How Global Universities are Reshaping the World.

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