Using a Tem Cell for Emc Measurements of Electronic Equipment (Classic Reprint) - Softcover

Crawford, M. L.

 
9781390511246: Using a Tem Cell for Emc Measurements of Electronic Equipment (Classic Reprint)

Synopsis

Excerpt from Using a Tem Cell for Emc Measurements of Electronic Equipment

Various approaches have been investigated to find ways by which to increase the test volume available in a cell without reducing its upper useful frequency. One is to design the cell with an off - set septum. Ah asymmetric or offset septum cell was fabricated as shown in the cross-sectional drawings of figure 12. The E-field distributions above and below the septum of this cell are shown in figure 13. This cell offers approximately 29% greater test volume in its lower half space than a symmetric cell of similar size with an equivalent high-frequency cutoff and resonance limitation. This additional test space, however, comes at the price of less test field uniformity and greater difficulty in using the cell at multimode frequencies. A previous publication comparing the characteristics of this cell with a symmetric cell of similar size is available for further study, if desired [8.

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9781396017551: Using a Tem Cell for EMC Measurements of Electronic Equipment (Classic Reprint)

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ISBN 10:  1396017550 ISBN 13:  9781396017551
Publisher: Forgotten Books, 2018
Hardcover