Excerpt from The Production of Elliptic Interferences in Relation to Interferometry, Vol. 3
The accompanying report contains a variety of investigations made at widely different times, but in all of which the displacement interferometer was used as a basis of measurement. It is thus a continuation of the work in the Carnegie Publications No. 149, 1911 and 1912.
In Chapter XII; the distance apart of the doublet interference patterns, obtained with plates of doubly-refracting crystals, is used for computing the corresponding ordinary and extraordinary indices of refraction of these crystals, in the case of light traveling through them in different directions. As quartz gives particularly beautiful and well-placed images, measure ments were made in greatest number by means of it, though other bodies were also studied. It is an essential feature of the method that the center of ellipses is never lost, but may be brought back into coincidence with the fiducial sodium line of the spectrum by the proportionate displacement of the mirror on the micrometer. Hence plates of glass or crystal of any thickness, or indeed columns of any length, are available for measurement. These wide limits of application are peculiarly favorable to certain accurate measurements. For instance, if a glass column 1 meter long is inserted, and the micrometer reads to but -4 centimeter, y - 1 (where u is the index of refraction) would be measurable to one part in a million. The method should therefore be useful to answer refined questions in refraction.
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Paperback. Condition: New. Print on Demand. This book explores the use of displacement interferometry to measure the optical properties of materials. Displacement interferometry is a technique that uses the interference of light to measure extremely small displacements. The author explores the history of the technique, its use in prior experiments, and potential uses in a variety of scientific fields. Expanding on previous work done by the author, this book demonstrates how displacement interferometry can extend the sensitivity of refractometers and shows how the technique can be used to investigate a material's response to varying temperatures, electric fields, and other external stimuli. The author also explores the technique's use in measuring acoustic displacements and dielectric polarization. This book's insights show how displacement interferometry can be used to investigate the properties of materials with high accuracy and sensitivity, providing valuable data for a wide range of scientific disciplines. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Seller Inventory # 9781333556662_0
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LW-9781333556662
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LW-9781333556662
Quantity: 15 available