Measurement Methods for the Semiconductor Device Industry: A Summary of Nbs Activity; December 1969 (Classic Reprint) - Softcover
Synopsis
Excerpt from Measurement Methods for the Semiconductor Device Industry: A Summary of Nbs Activity; December 1969
Key Words: carrier lifetime; germanium; lithium drifted gamma - ray detectors; resistivity; resistiv ity inhomogeneities; second breakdown; silicon.
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Measurement Methods for the Semiconductor Device Industry (Classic Reprint)
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Paperback. Condition: New. Print on Demand. This book summarizes the work at the National Bureau of Standards that led to the development of a broad program on Methods of Measurement for Semiconductors, Process Control, and Devices. The initial work was focused on resistivity of silicon wafers and second breakdown in transistors, and it expanded over time to include other projects such as germanium for gamma ray detectors, carrier lifetime, and resistivity inhomogeneities. The book describes the importance of semiconductor materials in the development of technology and the need for improved measurement methods throughout the manufacturing process to ensure device performance at higher power levels, at higher frequencies, and with greater reliability under both normal and abnormal conditions. The book also provides an overview of the work that was carried out on each of the projects, including the experimental setups, results obtained, and the development of new measurement methods. The book is written in a clear and concise style and is accessible to a wide range of readers, from those with a general interest in the field of semiconductors to those who are directly involved in the development and manufacture of semiconductor devices. The book's insights on the main subject are significant because they provide a comprehensive overview of the state-of-the-art in semiconductor measurement methods and highlight the need for continued research and development in this area. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Seller Inventory # 9781332928934_0
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Measurement Methods for the Semiconductor Device Industry A Summary of Nbs Activity December 1969 Classic Reprint
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LW-9781332928934
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Measurement Methods for the Semiconductor Device Industry A Summary of Nbs Activity December 1969 Classic Reprint
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LW-9781332928934
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